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Published in: Journal of Materials Science: Materials in Electronics 4/2014

01-04-2014

Study on low temperature sintering and electrical properties of CuO-doped Ca0.28Ba0.72Nb2O6 ceramics

Authors: Lingling Wei, Xiaokun Han, Xiaolian Chao, Huan Jiao, Zupei Yang

Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2014

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Abstract

Ca0.28Ba0.72Nb2O6 (CBN28) ceramics with different content of CuO were prepared by the conventional ceramic fabrication technique. The effects of CuO content on the phase structure, microstructure, dielectric and ferroelectric properties of obtained CBN28 ceramics were investigated. XRD results showed that pure tungsten bronze structure was obtained in all ceramics and CuO additive could accelerate the phase formation at lower temperatures. The CuO aid was effective for the uniform grain size in CBN28 ceramics, as it could facilitate the sintering behavior and suppress the anisotropic growth behavior obviously. The dielectric and ferroelectric properties of CBN28 ceramics depended greatly on the CuO content. Curie temperature T c and dielectric loss tanδ both shifted downward, whereas the maximum dielectric constant ε m and the dielectric constant around room temperature ε r all increased initially and then decreased as x increased from 0.1 to 0.4 wt%. Normal ferroelectric hysteresis loops could be observed in all compositions, and the remnant polarization P r decreased gradually. It was found that the comprehensive electric performance was optimized in CBN28-0.2 wt% CuO ceramics: ε r = 453, ε m = 3,371, T c = 226 °C, tanδ = 0.048, P r = 4.72 μC/cm2 and E c = 13.81 kV/cm, showed that CuO sintering aid could not only ameliorate the sintering behavior but also improve the electrical properties.

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Metadata
Title
Study on low temperature sintering and electrical properties of CuO-doped Ca0.28Ba0.72Nb2O6 ceramics
Authors
Lingling Wei
Xiaokun Han
Xiaolian Chao
Huan Jiao
Zupei Yang
Publication date
01-04-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 4/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1756-y

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