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Published in: Journal of Materials Science: Materials in Electronics 24/2018

24-10-2018

Synthesis and annealing effects on the optical spectroscopy properties of red-emitting Gd(P0.5V0.5)O4: x at.% Eu3+

Authors: Min Zhu, Chen Hu, Jianhong Li, Yuanquan Feng, Huilin Kong, Shakir Ullah, Maofan Li, Fei You, Bing Teng, Degao Zhong, Jie Tang

Published in: Journal of Materials Science: Materials in Electronics | Issue 24/2018

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Abstract

In this work, Gd(P0.5V0.5)O4: x at.% Eu3+ phosphors with different dopant concentrations (x = 1, 3, 5, 6, 7, 9) were synthesized through chemical coprecipitation method. The phosphors were characterized by XRD, SEM, infrared spectroscopy, photoluminescence excitation, emission spectra and CIE. The results of XRD indicate that the obtained phosphors have the tetragonal phase structure. Eu3+ emission transitions arise mainly from the 5D0 level to the 7FJ (J = 0, 1, 2, 3, 4) manifolds. The emission intensity and crystalline of Gd(P0.5V0.5)O4:x at% Eu3+ powders are increasing with annealing temperature at 600, 800, 1000, 1100, and 1200 °C, respectively. The introduction of VO43− can broaden the range of UV excitation spectrum wavelength and enhance the transition between 5D0 → 7F1 to 5D0 → 7F2 for long wavelength emission. And the most dominant emission peak of Eu3+ for 5D0 → 7F2 transition is closer to pure red light at 622 nm. The maximum emission intensity of the phosphors is the concentration of 6 at.% Eu3+ because of the distance of the neighbor Eu3+ ions reaching a certain critical value and the influence of multipolar interaction. Compared to commercial phosphors Y2O3:Eu3+ and (Y,Gd)BO3:Eu3+, our work yielded a longer wavelength red light emission intensity and a higher proportion of red light to orange light. All our results indicate that color purity of this phosphor turns it into a promising red phosphor in ultraviolet-pumped light-emitting diodes.

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Metadata
Title
Synthesis and annealing effects on the optical spectroscopy properties of red-emitting Gd(P0.5V0.5)O4: x at.% Eu3+
Authors
Min Zhu
Chen Hu
Jianhong Li
Yuanquan Feng
Huilin Kong
Shakir Ullah
Maofan Li
Fei You
Bing Teng
Degao Zhong
Jie Tang
Publication date
24-10-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 24/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-0198-3

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