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Published in: Journal of Materials Science: Materials in Electronics 1/2017

27-08-2016

The effect of infrared plasmon on the performance of Si-based THz detectors

Authors: He Zhu, Jintao Xu, Jiaqi Zhu, Miao Wang, Huizhen Wu, Ning Li, Ning Dai

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2017

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Abstract

Plasmons in metals have great impact on light emission, propagation, and detection in visible and infrared light wave frequencies. To explore plasmonic effect on the THz detection, both a backside-illuminated and a topside-illuminated blocking impurity band (BIB) THz detectors are developed and significant influence of plasmonic effect on the performance of BIB THz detectors is observed. The plasmonic effect in the heavily doped semiconductor layer of BIB THz detectors causes high reflectance of THz radiation which curtails the detection frequencies of the backside-illuminated BIB detectors. However, due to the advantages of flip-chip package and high quantum efficiency, the dark current, the responsivity, and the detectivity of the backside-illuminated detector shows superior characteristics to the topside-illuminated detector. The performance of the THz detector could be further improved with the suppression of the plasmonic effect.

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Metadata
Title
The effect of infrared plasmon on the performance of Si-based THz detectors
Authors
He Zhu
Jintao Xu
Jiaqi Zhu
Miao Wang
Huizhen Wu
Ning Li
Ning Dai
Publication date
27-08-2016
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-5598-7

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