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Published in: Journal of Materials Science: Materials in Electronics 3/2015

01-03-2015 | Review

The effect of structural phase transition on the magnetic properties of BiFeO3 thin films

Authors: Y. Q. Liu, Y. J. Wang, J. Zhang, Y. H. Wu, Y. J. Zhang, M. B. Wei, J. H. Yang

Published in: Journal of Materials Science: Materials in Electronics | Issue 3/2015

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Abstract

Bi1-xErxFeO3 (x = 0, 0.05, 0.1 and 0.15 respectively) thin films were prepared by the ethylene glycol based sol–gel spin-coating method on cleaned Si (100) substrates. Effects of Er concentration on the phase formation, surface morphology and magnetic properties of BFO films were systematically investigated. Moreover, the oxidation state of Fe ion was studied by X-ray photoemission spectroscopy. X-ray diffraction and Raman spectroscopy indicated the substitutions of Er into the Bi site and a phase transition from rhombohedral to orthorhombic with Er-substitution. Scanning electron microscope and transmission electron microscope used to analyze the morphologies and microstructures of the thin films. In comparison with the other thin films studied here, the Bi0.9Er0.1FeO3 thin film exhibited the largest magnetization and a smooth morphology. The possible reasons for the enhancement of the magnetization of these films were discussed.

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Metadata
Title
The effect of structural phase transition on the magnetic properties of BiFeO3 thin films
Authors
Y. Q. Liu
Y. J. Wang
J. Zhang
Y. H. Wu
Y. J. Zhang
M. B. Wei
J. H. Yang
Publication date
01-03-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2608-5

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