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2016 | OriginalPaper | Chapter

Towards MC/DC Coverage of Properties Specification Patterns

Authors : Ana C. V. de Melo, Corina S. Păsăreanu, Simone Hanazumi

Published in: Theoretical Aspects of Computing – ICTAC 2016

Publisher: Springer International Publishing

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Abstract

Model based testing is used to validate the actual system against its requirements described as formal specification, while formal verification proves that a requirement is not violated in the overall system. Verifying properties, in certain cases, becomes very expensive (or unpractical), mainly when the application of test techniques is enough for the users purposes. The Modified Condition/Decision Coverage (MC/DC), used in the avionics software industry, is recognised as a good technique to find out the possible mistakes on programs logics because it covers how each condition can affect the programs’ decisions outcomes. It has also been adapted to provide the coverage of specifications in the requirements-based approach.
This paper proposes a technique to decompose properties (specifications), defined as regular expressions, into subexpressions representing test cases to cover the MD/DC for specifications (Unique First Word Recognition). Then, instead of proving an entire property, we can use a model checker to observe and select program executions that cover all the test cases given as the subexpressions. To support this approach, we give a syntactic characterisation of the properties decomposition, inductively defined over the syntax of regular expressions, and show how to use the technique to decompose Specification Patterns (SPS) and monitor their satisfiability using the Java PathFinder (JPF).

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Appendix
Available only for authorised users
Footnotes
1
Here, we use the relaxed term “recognised by a regular expression” meaning “recognised by a an automaton that recognises the language defined by a regular expression”.
 
2
Operator ? does not appear in the definition because it can be defined using the \(\mid \) operator.
 
Literature
1.
go back to reference Ammann, P., Offutt, J.: Introduction to Software Testing, vol. 54. Cambridge University Press, Cambridge (2008)CrossRefMATH Ammann, P., Offutt, J.: Introduction to Software Testing, vol. 54. Cambridge University Press, Cambridge (2008)CrossRefMATH
2.
go back to reference Dwyer, M.B., Avrunin, G.S., Corbett, J.C.: Patterns in property specifications for finite-state verification. In: Proceedings of the 21st International Conference on Software Engineering, ICSE 1999, pp. 411–420. ACM, New York (1999) Dwyer, M.B., Avrunin, G.S., Corbett, J.C.: Patterns in property specifications for finite-state verification. In: Proceedings of the 21st International Conference on Software Engineering, ICSE 1999, pp. 411–420. ACM, New York (1999)
3.
go back to reference Fraser, G., Wotawa, F., Ammann, P.E.: Testing with model checkers: a survey. Softw. Test. Verif. Reliab. 19(3), 215–261 (2009)CrossRef Fraser, G., Wotawa, F., Ammann, P.E.: Testing with model checkers: a survey. Softw. Test. Verif. Reliab. 19(3), 215–261 (2009)CrossRef
4.
go back to reference Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. SIGSOFT Softw. Eng. Not. 24(6), 146–162 (1999)CrossRef Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. SIGSOFT Softw. Eng. Not. 24(6), 146–162 (1999)CrossRef
5.
go back to reference Hanazumi, S., de Melo, A.C.V., Păsăreanu, C.S.: From testing purposes to formal JPF properties. In: Java PathFinder Workshop. ACM (2014) Hanazumi, S., de Melo, A.C.V., Păsăreanu, C.S.: From testing purposes to formal JPF properties. In: Java PathFinder Workshop. ACM (2014)
6.
go back to reference Hesari, S., Behjati, R., Yue, T.: Towards a systematic requirement-based test generation framework: industrial challenges and needs. In: Proceedings of the 2013 21st IEEE International Requirements Engineering Conference, RE 2013, pp. 261–266 (2013) Hesari, S., Behjati, R., Yue, T.: Towards a systematic requirement-based test generation framework: industrial challenges and needs. In: Proceedings of the 2013 21st IEEE International Requirements Engineering Conference, RE 2013, pp. 261–266 (2013)
7.
go back to reference Holloway, C.: Towards understanding the DO-178C/ED-12C assurance case. In: 7th IET International Conference on System Safety, Incorporating the Cyber Security Conference 2012, p. 14. Institution of Engineering and Technology (2012) Holloway, C.: Towards understanding the DO-178C/ED-12C assurance case. In: 7th IET International Conference on System Safety, Incorporating the Cyber Security Conference 2012, p. 14. Institution of Engineering and Technology (2012)
9.
go back to reference Pecheur, C., Raimondi, F., Brat, G.: A formal analysis of requirements-based testing. In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, pp. 47–56 (2009) Pecheur, C., Raimondi, F., Brat, G.: A formal analysis of requirements-based testing. In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, pp. 47–56 (2009)
10.
go back to reference Pnueli, A.: The temporal logic of programs. In: SFCS 1977: Proceedings of the 18th Annual Symposium on Foundations of Computer Science, pp. 46–57. IEEE Computer Society, Washington, DC (1977) Pnueli, A.: The temporal logic of programs. In: SFCS 1977: Proceedings of the 18th Annual Symposium on Foundations of Computer Science, pp. 46–57. IEEE Computer Society, Washington, DC (1977)
11.
go back to reference Rajan, A., Whalen, M., Staats, M., Heimdahl, M.P.E.: Requirements coverage as an adequacy measure for conformance testing. In: Liu, S., Maibaum, T., Araki, K. (eds.) ICFEM 2008. LNCS, vol. 5256, pp. 86–104. Springer, Heidelberg (2008). doi:10.1007/978-3-540-88194-0_8 CrossRef Rajan, A., Whalen, M., Staats, M., Heimdahl, M.P.E.: Requirements coverage as an adequacy measure for conformance testing. In: Liu, S., Maibaum, T., Araki, K. (eds.) ICFEM 2008. LNCS, vol. 5256, pp. 86–104. Springer, Heidelberg (2008). doi:10.​1007/​978-3-540-88194-0_​8 CrossRef
12.
go back to reference Sametinger, J., Rozenblit, J., Lysecky, R., Ott, P.: Security challenges for medical devices. Commun. ACM 58(4), 74–82 (2015)CrossRef Sametinger, J., Rozenblit, J., Lysecky, R., Ott, P.: Security challenges for medical devices. Commun. ACM 58(4), 74–82 (2015)CrossRef
13.
14.
go back to reference Tan, L., Sokolsky, O., Lee, I.: Specification-based testing with linear temporal logic. In: Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI 2004 (2004) Tan, L., Sokolsky, O., Lee, I.: Specification-based testing with linear temporal logic. In: Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI 2004 (2004)
15.
go back to reference Whalen, M.W., Rajan, A., Heimdahl, M.P., Miller, S.P.: Coverage metrics for requirements-based testing. In: International Symposium on Software Testing and Analysis, p. 25 (2006) Whalen, M.W., Rajan, A., Heimdahl, M.P., Miller, S.P.: Coverage metrics for requirements-based testing. In: International Symposium on Software Testing and Analysis, p. 25 (2006)
Metadata
Title
Towards MC/DC Coverage of Properties Specification Patterns
Authors
Ana C. V. de Melo
Corina S. Păsăreanu
Simone Hanazumi
Copyright Year
2016
DOI
https://doi.org/10.1007/978-3-319-46750-4_10

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