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Published in: Journal of Materials Science: Materials in Electronics 7/2015

01-07-2015

Ultrafine Pt nanoparticle induced doping/strain of single layer graphene: experimental corroboration between conduction and Raman characteristics

Authors: Haisheng Zheng, Somik Mukherjee, Keshab Gangopadhyay, Shubhra Gangopadhyay

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2015

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Abstract

The doping/strain induced by ultrafine sputtered Pt nanoparticles (NPs) of different sizes on single layer graphene is studied through conduction channel modification of graphene-based field-effect transistors and subsequent Raman characterization. For sub-nm (0.5 nm) sized Pt NPs, a substantial Dirac point shift is observed in the I–V characteristics, suggestive of n-type doping of the large area single layer graphene through the process of charge transfer and chemical interaction. Conversely, for larger (1.1 nm) Pt NPs, minimal Dirac point shift is observed, indicating lack of the charge transfer induced doping effect. The representative Raman signatures corroborate with the electrical characterization results and indicate while charge transfer dominates Raman peak shift for the 0.5 nm Pt NP decorated graphene, strain effect dominates in case of the larger 1.1 nm Pt NP.

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Metadata
Title
Ultrafine Pt nanoparticle induced doping/strain of single layer graphene: experimental corroboration between conduction and Raman characteristics
Authors
Haisheng Zheng
Somik Mukherjee
Keshab Gangopadhyay
Shubhra Gangopadhyay
Publication date
01-07-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 7/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3043-y

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