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Metallurgical and Materials Transactions B
Published in: Metallurgical and Materials Transactions B 5/2011

01-10-2011

X-Ray Photoelectron Spectroscopy Depth Profiling of Electrochemically Prepared Thin Oxide Layers on Duplex Stainless Steel

Authors: Črtomir Donik, Aleksandra Kocijan, Djordje Mandrino, Monika Jenko

Published in: Metallurgical and Materials Transactions B | Issue 5/2011

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Abstract

The surface oxidation of duplex stainless steel (DSS 2205) was studied by X-ray photoelectron spectroscopy (XPS). The experiments were performed on the alloy after controlled oxidation in a chloride-enriched solution at controlled potentials. The evolution of the passive film formed on the DSS in a chloride solution was studied using cyclic voltammetry with XPS surface characterization at selected potentials. The evolution of the oxide films and its specific compositions formed on the DSS was studied as a function of depth. Fe/Cr oxidized layers and oxide thicknesses were observed and correlated with the various potentiostatic potentials. The importance of Mo and Cr inside the oxide films in this article is studied and described, whereas their role in the protective layer, as oxides, is significant.
previous article Effects of Residual Elements Arsenic, Antimony, and Tin on Surface Hot Shortness
next article Simulation of the Fluid Flow-Related Phenomena in the Electrolyte of an Aluminum Electrolysis Cell

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Metadata
Title
X-Ray Photoelectron Spectroscopy Depth Profiling of Electrochemically Prepared Thin Oxide Layers on Duplex Stainless Steel
Authors
Črtomir Donik
Aleksandra Kocijan
Djordje Mandrino
Monika Jenko
Publication date
01-10-2011
Publisher
Springer US
Published in
Metallurgical and Materials Transactions B / Issue 5/2011
Print ISSN: 1073-5615
Electronic ISSN: 1543-1916
DOI
https://doi.org/10.1007/s11663-011-9532-3

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