Skip to main content
Top
Published in: Journal of Computational Electronics 3/2020

16-06-2020

A charge-plasma-based dual-metal-gate recessed-source/drain dopingless junctionless transistor with enhanced analog and RF performance

Authors: Prateek Kishor Verma, Yogesh Kumar Verma, Varun Mishra, Santosh Kumar Gupta

Published in: Journal of Computational Electronics | Issue 3/2020

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

A distinctive charge plasma approach is used to propose a novel dual-metal-gate (DMG) recessed-source/drain dopingless junctionless transistor (Re S/D DLJLT) in which the source/drain (S/D) series resistance is reduced without any increment of the gate-to-drain Miller capacitance. In this device, the charge plasma approach is applied to induce an N+ (virtually doped) S/D region by using metals with appropriate work functions for the electrodes. The direct-current (DC) and analog/radio frequency (RF) figures of merit (FOMs) of the proposed device are analyzed using two-dimensional (2-D) numerical calculations and compared with those for a DMG recessed-source/drain junction transistor (Re S/D JT) of identical dimensions. The results reveal that the DMG-Re S/D DLJLT exhibits enhanced DC and analog/RF performance compared with the DMG-Re S/D JT. The total gate length (L) is divided between the control gate (L1) and screen gate (L2), and the numerical investigations are carried out with different ratios of the control gate to screen gate lengths (L1:L2) to determine the optimized gate length for the DMG. A subthreshold slope of 61.32 mV/dec is obtained for the proposed device with L1:L2 = 1:1. An improvement in the ON-state current (ION) is observed due to the introduction of the charge plasma concept, which also reduces the OFF-state leakage current (IOFF) and causes a net enhancement in the ION/IOFF ratio. The device proposed herein also solves the problems of random doping fluctuation, doping activation, and threshold voltage variation and may thus be preferred over DMG-Re S/D JTs for use in analog/RF and digital applications due to its improved performance.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference Edgar, L.J.: Method and apparatus for controlling electric currents. U.S. Patent 1,745,175, issued January 28, 1930 Edgar, L.J.: Method and apparatus for controlling electric currents. U.S. Patent 1,745,175, issued January 28, 1930
3.
go back to reference Moore, G.E.: Cramming more components onto integrated circuits, pp. 114–117 (1965) Moore, G.E.: Cramming more components onto integrated circuits, pp. 114–117 (1965)
5.
go back to reference Choi, Y.K., Asano, K., Lindert, N., Subramanian, V., King, T.J., Bokor, J., Hu, C.: Ultra-thin body SOI MOSFET for deep-sub-tenth micron era. In: International Electron Devices Meeting 1999. Technical Digest (Cat. No. 99CH36318) (pp. 919–921). IEEE (1999). https://doi.org/10.1109/IEDM.1999.824298 Choi, Y.K., Asano, K., Lindert, N., Subramanian, V., King, T.J., Bokor, J., Hu, C.: Ultra-thin body SOI MOSFET for deep-sub-tenth micron era. In: International Electron Devices Meeting 1999. Technical Digest (Cat. No. 99CH36318) (pp. 919–921). IEEE (1999). https://​doi.​org/​10.​1109/​IEDM.​1999.​824298
6.
go back to reference Doris, B., Ieong, M., Kanarsky, T., Zhang, Y., Roy, R.A., Dokumaci, O., Ren, Z., Jamin, F.F., Shi, L., Natzle, W., Huang, H.J.: Extreme scaling with ultra-thin Si channel MOSFETs. In: Digest—International Electron Devices Meeting (pp. 267–270). IEEE (2002). https://doi.org/10.1109/IEDM.2002.1175829 Doris, B., Ieong, M., Kanarsky, T., Zhang, Y., Roy, R.A., Dokumaci, O., Ren, Z., Jamin, F.F., Shi, L., Natzle, W., Huang, H.J.: Extreme scaling with ultra-thin Si channel MOSFETs. In: Digest—International Electron Devices Meeting (pp. 267–270). IEEE (2002). https://​doi.​org/​10.​1109/​IEDM.​2002.​1175829
28.
go back to reference Verma P.K., Rawat, A.S., Gupta, S.K.: Temperature-dependent analog, RF, and linearity analysis of junctionless quadruple gate MOSFETs for analog applications. In: Advances in VLSI, Communication, and Signal Processing, pp. 355–366. Springer, Singapore (2020). https://doi.org/10.1007/978-981-32-9775-3_32 Verma P.K., Rawat, A.S., Gupta, S.K.: Temperature-dependent analog, RF, and linearity analysis of junctionless quadruple gate MOSFETs for analog applications. In: Advances in VLSI, Communication, and Signal Processing, pp. 355–366. Springer, Singapore (2020). https://​doi.​org/​10.​1007/​978-981-32-9775-3_​32
29.
go back to reference Verma, P.K., Mishra, V., Verma, Y.K., Yadav, P.K., Gupta, S.K: A novel dual material extra insulator layer fin field effect transistor for high-performance nanoscale applications. In: Advances in VLSI, Communication, and Signal Processing, pp. 377–385. Springer, Singapore (2020). https://doi.org/10.1007/978-981-32-9775-3_34 Verma, P.K., Mishra, V., Verma, Y.K., Yadav, P.K., Gupta, S.K: A novel dual material extra insulator layer fin field effect transistor for high-performance nanoscale applications. In: Advances in VLSI, Communication, and Signal Processing, pp. 377–385. Springer, Singapore (2020). https://​doi.​org/​10.​1007/​978-981-32-9775-3_​34
33.
go back to reference Sahay, S., Kumar, M.J.: Junctionless Field-Effect Transistors: Design, Modeling, and Simulation. Wiley, Hoboken (2019)CrossRef Sahay, S., Kumar, M.J.: Junctionless Field-Effect Transistors: Design, Modeling, and Simulation. Wiley, Hoboken (2019)CrossRef
40.
go back to reference ATLAS.: ATLAS User Manual. Silvaco International. Santa Clara, CA (2015) ATLAS.: ATLAS User Manual. Silvaco International. Santa Clara, CA (2015)
Metadata
Title
A charge-plasma-based dual-metal-gate recessed-source/drain dopingless junctionless transistor with enhanced analog and RF performance
Authors
Prateek Kishor Verma
Yogesh Kumar Verma
Varun Mishra
Santosh Kumar Gupta
Publication date
16-06-2020
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 3/2020
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-020-01528-z

Other articles of this Issue 3/2020

Journal of Computational Electronics 3/2020 Go to the issue