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Soft Computing
Published in: Soft Computing 13/2018

14-07-2017 | Focus

Automatic image thresholding using Otsu’s method and entropy weighting scheme for surface defect detection

Authors: Mai Thanh Nhat Truong, Sanghoon Kim

Published in: Soft Computing | Issue 13/2018

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Abstract

Defect detection is one of the most important tasks and a challenging problem for industrial quality control. Among the available visual inspection techniques, automatic thresholding is a commonly used approach for defect detection because of the simplicity in terms of its implementation and computing. In this paper, we propose an automatic thresholding technique, which is an improvement in Otsu’s method, using an entropy weighting scheme. The proposed method enables the detection of extremely small defect regions compared to the product surface area. Experimental results confirm the efficiency of the proposed system over other techniques.
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Metadata
Title
Automatic image thresholding using Otsu’s method and entropy weighting scheme for surface defect detection
Authors
Mai Thanh Nhat Truong
Sanghoon Kim
Publication date
14-07-2017
Publisher
Springer Berlin Heidelberg
Published in
Soft Computing / Issue 13/2018
Print ISSN: 1432-7643
Electronic ISSN: 1433-7479
DOI
https://doi.org/10.1007/s00500-017-2709-1

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