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Published in: Journal of Materials Science: Materials in Electronics 4/2014

01-04-2014

Characterization of Ba4.5Re9Ti18O54 (Re = La, Nd) microwave dielectric ceramics

Authors: Raz Muhammad, Yaseen Iqbal, Carlos R. Rambo

Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2014

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Abstract

Ba4.5Re9Ti18O54 (Re = La, Nd) ceramics were prepared via a solid state mixed oxide route. X-ray diffraction (XRD) analysis revealed the formation of the major Ba4.5Re9Ti18O54 phase along with rutile (TiO2) as a secondary phase. Rietveld structure refinement of the recorded XRD data confirmed that the crystal structure of Ba4.5Nd9Ti18O54 (BNT) was orthorhombic (Pnma) with unit cell parameters a = 22.3412 Å, b = 7.6824 Å and c = 12.1952 Å. Ba4.5La9Ti18O54 (BLT) exhibited high relative permittivity (95.6), low quality factor (2,102 GHz) and a high temperature coefficient of resonance frequency (+352 ppm/°C). The substitution of Nd for La caused a decrease in both the relatively permittivity and temperature coefficient of resonance frequency to 84.2 and 167 ppm/°C respectively and an increase in quality factor to 8,007 GHz. Raman spectroscopic analysis revealed that lattice defects may be responsible for the observed decrease in quality factor of BLT ceramics in comparison to BNT. The Raman shifts at 533.5 and 613.6 cm−1, related to Ti–O bond stretching, decreased for BNT ceramics, which may be a possible reason for the observed decrease in relative permittivity.

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Metadata
Title
Characterization of Ba4.5Re9Ti18O54 (Re = La, Nd) microwave dielectric ceramics
Authors
Raz Muhammad
Yaseen Iqbal
Carlos R. Rambo
Publication date
01-04-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 4/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1779-4

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