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Published in: Journal of Materials Science: Materials in Electronics 21/2018

07-09-2018

Characterization of temperature sensitivity of V-modified CuFe2O4 ceramics for NTC thermistors

Authors: Ya Liu, Hong Zhang, Weiyi Fu, Zefang Yang, Zhicheng Li

Published in: Journal of Materials Science: Materials in Electronics | Issue 21/2018

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Abstract

Copper ferrite ceramics, CuFe2−xVxO4 (x = 0, 0.015, 0.03, 0.04 and 0.05), were prepared by a wet-chemical synthesis method followed by the traditional ceramic sintering process. The influence of V-ion content on phase component, ionic valence states, microstructures and electrical properties of the ceramics was investigated. The X-ray diffraction analysis shows that all the ceramics have cubic structure of spinel CuFe2O4 phase. All ceramics show the typical characteristic of negative temperature coefficient (NTC) of resistivity in the measurement temperature region between 25 and 250 °C. The temperature-sensitivity parameters of the ceramics can be adjusted from 3319 to 4920 K by changing the content of V-ions. The analysis of complex impedance revealed that both grain effect and grain-boundary effect contributed to the electrical properties of the ceramics. The possible conduction mechanism was proposed to be a thermal-activated polaron hopping conduction.

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Metadata
Title
Characterization of temperature sensitivity of V-modified CuFe2O4 ceramics for NTC thermistors
Authors
Ya Liu
Hong Zhang
Weiyi Fu
Zefang Yang
Zhicheng Li
Publication date
07-09-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 21/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-0005-1

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