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Published in: Journal of Materials Science: Materials in Electronics 2/2016

24-10-2015

Correlation between the microstructure and electrical properties of Bi–As2S3 quasibinar chalcogenides by using AC impedance spectroscopy

Authors: M. V. Šiljegović, D. L. Sekulić, S. R. Lukić Petrović, D. M. Petrović

Published in: Journal of Materials Science: Materials in Electronics | Issue 2/2016

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Abstract

The objective of this paper was to study the AC impedance of Bi5(As2S3)95 and Bi7(As2S3)93 chalcogenides in a frequency range of 100 Hz to 1 MHz at different temperatures. A preliminary structural analysis of the compounds by X-ray diffraction technique and scanning electron microscope confirmed the amorphous character for the sample with x = 5 at.% Bi and the existence of two phases (amorphous + crystalline) for the sample with x = 7 at.%. Therefore, the AC impedance analysis by means of an equivalent circuit model was used to establish correlation between the distinct microstructures and electrical properties of these compounds. The presence of the glassy matrix and matrix–crystal interface effects was observed in the sample Bi7(As2S3)93. Moreover, the analysis of impedance data indicated the decrease of resistance with temperature for both samples usually shown by semiconductors i.e. negative temperature coefficient of resistance. The present Bi–As2S3 quasibinar chalcogenides also exhibit the temperature dependent relaxation phenomena. According to estimated values of activation energy of relaxation processes, it was concluded that the mechanisms of conductivity and relaxation are the same in both samples.

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Footnotes
1
***Powder Diffraction File 1986 Inorganic Phases International Centre for Diffraction data, Park Line Swarthmore
 
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Metadata
Title
Correlation between the microstructure and electrical properties of Bi–As2S3 quasibinar chalcogenides by using AC impedance spectroscopy
Authors
M. V. Šiljegović
D. L. Sekulić
S. R. Lukić Petrović
D. M. Petrović
Publication date
24-10-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 2/2016
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3937-8

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