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Published in:
01-04-2012
Damping properties of epoxy-based composite embedded with sol–gel-derived Pb(Zr0.53Ti0.47)O3 thin film annealed at different temperatures
Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2012
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Abstract
Pb(Zr0.53Ti0.47)O3 (PZT) thin films were prepared on Pt/Ti/SiO2/Si substrate by sol–gel method. The effect of annealing temperature on microstructure, ferroelectric and dielectric properties of PZT films was investigated. When the films were annealed at 550–850 °C, the single-phase PZT films were obtained. PZT films annealed at 650–750 °C had better dielectric and ferroelectric properties. The sandwich composites with epoxy resin/PZT film with substrate/epoxy resin were prepared. The annealing temperature of PZT films influenced their damping properties, and the epoxy-based composites embedded with PZT film annealed at 700 °C had the largest damping loss factor of 0.923.