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Journal of Electronic Materials
Published in: Journal of Electronic Materials 6/2010

01-06-2010

Defect-Related White-Light Emission from ZnO in an n-Mg0.2Zn0.8O/n-ZnO/SiO x Heterostructure on n-Si

Authors: Peiliang Chen, Xiangyang Ma, Yuanyuan Zhang, Dongsheng Li, Deren Yang

Published in: Journal of Electronic Materials | Issue 6/2010

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previous article Correlation Between Oxygen Precipitation and Extended Defects in Czochralski Silicon: Investigation by Means of Scanning Infrared Microscopy
next article The Use of Spatial Analysis Techniques in Defect and Nanostructure Studies

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Metadata
Title
Defect-Related White-Light Emission from ZnO in an n-Mg0.2Zn0.8O/n-ZnO/SiO x Heterostructure on n-Si
Authors
Peiliang Chen
Xiangyang Ma
Yuanyuan Zhang
Dongsheng Li
Deren Yang
Publication date
01-06-2010
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 6/2010
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-010-1173-9

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Correlation Between Oxygen Precipitation and Extended Defects in Czochralski Silicon: Investigation by Means of Scanning Infrared Microscopy

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