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Journal of Electronic Testing
Published in: Journal of Electronic Testing 2/2013

01-04-2013

Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems

Authors: S. Bergaoui, A. Wecxsteen, R. Leveugle

Published in: Journal of Electronic Testing | Issue 2/2013

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Abstract

Several criteria can be used to evaluate the criticality of registers and memory locations at compile time. This evaluation is useful to guide optimizations with respect to robustness constraints and soft error mitigation. In this paper, we analyze in detail the impact of compilation optimizations on the system dependability, using four different criteria. We show that optimizations enabled by default lead to criticality increase. However, selectively picking optimizations may increase the robustness of a system even if the consequences of a given optimization option may vary from a program to another. We also identify some optimizations that induce a significant increase in criticality and must be used with care.
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Appendix
Available only for authorised users
Literature
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Metadata
Title
Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems
Authors
S. Bergaoui
A. Wecxsteen
R. Leveugle
Publication date
01-04-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5371-2

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