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Published in: Journal of Electronic Testing 2/2013

01-04-2013

Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification

Authors: Edgar Leonardo Romero, Marius Strum, Wang Jiang Chau

Published in: Journal of Electronic Testing | Issue 2/2013

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Abstract

The constant pressure for making functional verification more agile has led to the conception of coverage driven verification (CDV) techniques. CDV has been implemented in verification testbenches using supervised learning techniques to model the relationship between coverage events and stimuli generation, providing a feedback between them. One commonly used technique is the classification- or decision-tree data mining, which has shown to be appropriate due to the easy modeling. Learning techniques are applied in two steps: training and application. Training is made on one or more sets of examples, which relate datasets to pre-determined classes. Precision of results by applying the predictive learning concept has shown to be sensitive to the size of the training set and the amount of imbalance of associated classes, this last meaning the number of datasets associated to each class is very different from each other. This work presents experiments on the manipulation of data mining training sets, by changing the size and reducing the imbalances, in order to check their influence on the CDV efficiency. To do that, a circuit example with a large input space and strong class imbalance was selected from the application domain of multimedia systems and another one, with a small input space that affects the coverage occurrences, was selected from the communication area.

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Footnotes
1
Data mining refers to a variety of different learning techniques [17]. By following [5], in this article we will consider this term equivalent to the more specific classification-tree or decision-tree based data mining.
 
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Metadata
Title
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
Authors
Edgar Leonardo Romero
Marius Strum
Wang Jiang Chau
Publication date
01-04-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5372-1

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