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Published in: Journal of Materials Science: Materials in Electronics 5/2014

01-05-2014

Diffuse phase transition and leakage current characteristics of (Pb0.25Sr0.75)TiO3 thin films prepared by a sol–gel process

Authors: T. D. Cheng, X. G. Tang, Y. P. Jiang, Q. X. Liu

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2014

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Abstract

Nanocrystalline (Pb0.25Sr0.75)TiO3 (PSrT25) thin films were grown on Pt/Ti/SiO2/Si substrates by using a sol–gel process. The dielectric constant and loss tanδ of Au/PSrT/Pt thin-films capacitor were 345 and 0.016 at 100 kHz, respectively. The dielectric constant of PSrT film changes significantly with applied dc bias field and has a tunability of 22.7 % under an applied field of 150 kV/cm. Phase transition of the PSrT25 film has shown the diffuse-type phase transition behavior. The leakage current varied depending on the voltage polarity. At low electrical field and with Au electrode biased negatively, the Au/PSrT interface exhibits a Schottky emission characteristic, while at higher fields, Poole–Frenkel dominated the electronic conduction.

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Metadata
Title
Diffuse phase transition and leakage current characteristics of (Pb0.25Sr0.75)TiO3 thin films prepared by a sol–gel process
Authors
T. D. Cheng
X. G. Tang
Y. P. Jiang
Q. X. Liu
Publication date
01-05-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1842-1

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