Skip to main content
Top
Published in: Journal of Electronic Testing 3/2011

01-06-2011

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

Authors: Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell

Published in: Journal of Electronic Testing | Issue 3/2011

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This paper presents an extension of the ANC (“Analogue Network of Converters”)-based method, which is an original Design-for-Test (DfT) technique associated to a dedicated test algorithm to characterize the harmonic components of a set of embedded converters using only digital test resources. The ANC-based method was primarily developed under the assumption that the harmonics’ phase is proportional to the input phase. This assumption is not valid for all converter architectures, where filtering effects may affect the harmonics’ phase. The improved ANC-based method is able to calculate the magnitude of the harmonic components with unknown phase. The fundamental principle of this improved version of the ANC-based method is the same, but further mathematical developments have been established using a model independent from the harmonics’ phase. The simulation results and the experiments show an excellent agreement between the values measured using the method and the values measured with a usual test setup, for the THD and SFDR parameters. Simulations were carried out considering both random phases and realistic phase delays such as the ones induced by a low pass filter.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Show more products
Literature
1.
go back to reference Adamo F, Attivissimo F, Giaquinto N, Savino M (2002) FFT Test of A/D Converters to Determine the Integral Nonlinearity. IEEE Trans Instrum Meas 51(5):1050–1054CrossRef Adamo F, Attivissimo F, Giaquinto N, Savino M (2002) FFT Test of A/D Converters to Determine the Integral Nonlinearity. IEEE Trans Instrum Meas 51(5):1050–1054CrossRef
2.
go back to reference Arabi K, Kaminska B, Rzeszut J (1994) A New Built-In Self Test Approach For Digital-to-Analog and Analog-to-Digital Converters. Proc IEEE Int Conf Comp Aided Des :491–494 Arabi K, Kaminska B, Rzeszut J (1994) A New Built-In Self Test Approach For Digital-to-Analog and Analog-to-Digital Converters. Proc IEEE Int Conf Comp Aided Des :491–494
3.
go back to reference Azais F, Bernard S, Bertrand Y, Renovell M (2001) Implementation of a linear histogram BIST for ADCs. Proc Conference and Exhibition Design, Automation and Test in Europe :590–595 Azais F, Bernard S, Bertrand Y, Renovell M (2001) Implementation of a linear histogram BIST for ADCs. Proc Conference and Exhibition Design, Automation and Test in Europe :590–595
4.
go back to reference Azais F, Bernard S, Betrand Y, Renovell M (2000) Towards an ADC BIST scheme using the histogram test technique. Proc IEEE European Test Workshop :53–58 Azais F, Bernard S, Betrand Y, Renovell M (2000) Towards an ADC BIST scheme using the histogram test technique. Proc IEEE European Test Workshop :53–58
5.
go back to reference Burns M, Roberts GW (2001) An Introduction to mixed-signal IC test and measurement. Oxford University Press, ISBN 0195140168 Burns M, Roberts GW (2001) An Introduction to mixed-signal IC test and measurement. Oxford University Press, ISBN 0195140168
6.
go back to reference Huertas JL (2004) Test and design-for-testability in mixed-signal integrated circuits. Springer Press, ISBN 14020077246 Huertas JL (2004) Test and design-for-testability in mixed-signal integrated circuits. Springer Press, ISBN 14020077246
7.
go back to reference “IEEE standard for terminology and test methods for analog-to-digital converters”, IEEE Std 1241–2000 “IEEE standard for terminology and test methods for analog-to-digital converters”, IEEE Std 1241–2000
8.
go back to reference Janik J-M (2003) Estimation of A/D Converter Nonlinearities from complex Spectrum. Proc. International Workshop on ADC Modeling and Testing :8–10 Janik J-M (2003) Estimation of A/D Converter Nonlinearities from complex Spectrum. Proc. International Workshop on ADC Modeling and Testing :8–10
9.
go back to reference Janik JM, Fresnaud V (2007) A Spectral approach to estimate the INL of A/D converter. Comput Stand Interfaces J 29(1):31–37CrossRef Janik JM, Fresnaud V (2007) A Spectral approach to estimate the INL of A/D converter. Comput Stand Interfaces J 29(1):31–37CrossRef
10.
go back to reference Jiang H, Chen D, Geiger RL (2005) Dither Incorporated Deterministic Dynamic Element Matching for High Resolution ADC Test Using Extremely Low Resolution DACs. Proc IEEE Int Symposium on Circuits Syst :4285–4288 Jiang H, Chen D, Geiger RL (2005) Dither Incorporated Deterministic Dynamic Element Matching for High Resolution ADC Test Using Extremely Low Resolution DACs. Proc IEEE Int Symposium on Circuits Syst :4285–4288
11.
go back to reference Kerzérho V, Cauvet P, Bernard S, Azaïs F, Comte M, Renovell M (2006) “Analogue Network of Converters”: a DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. Proc IEEE Eur Test Symp :159–164 Kerzérho V, Cauvet P, Bernard S, Azaïs F, Comte M, Renovell M (2006) “Analogue Network of Converters”: a DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. Proc IEEE Eur Test Symp :159–164
12.
go back to reference Kerzérho V, Cauvet P, Bernard S, Azaïs F, Renovell M, Comte M (2006) A novel DFT technique to test a complete set of ADC’s and DAC’s embedded in a complex SiP. IEEE Des Test Comput J 23(3):234–243CrossRef Kerzérho V, Cauvet P, Bernard S, Azaïs F, Renovell M, Comte M (2006) A novel DFT technique to test a complete set of ADC’s and DAC’s embedded in a complex SiP. IEEE Des Test Comput J 23(3):234–243CrossRef
13.
go back to reference Kerzérho V, Cauvet P, Bernard S, Azaïs F, Renovell M, Comte M, Chakib O (2008) ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, vol. 2008, Article ID 482159, 8 pages Kerzérho V, Cauvet P, Bernard S, Azaïs F, Renovell M, Comte M, Chakib O (2008) ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, vol. 2008, Article ID 482159, 8 pages
14.
go back to reference Mahoney M (1987) DSP-Based Testing of Analog and Mixed-Signal Circuits. IEEE Comp Soc Press, ISBN 0-8186-0785-8 Mahoney M (1987) DSP-Based Testing of Analog and Mixed-Signal Circuits. IEEE Comp Soc Press, ISBN 0-8186-0785-8
15.
go back to reference Nagi N, Chatterjee A, Abraham J (1994) A Signature Analyzer for Analog and Mixed-Signal Circuits. Proc IEEE Int Conf Comput Des :284–287 Nagi N, Chatterjee A, Abraham J (1994) A Signature Analyzer for Analog and Mixed-Signal Circuits. Proc IEEE Int Conf Comput Des :284–287
16.
go back to reference Ohletz MJ (1991) Hybrid Built In Self Test (HBIST) for Mixed Analog/Digital Integrated Circuits. Proc IEEE Eur Test Conf :307–316 Ohletz MJ (1991) Hybrid Built In Self Test (HBIST) for Mixed Analog/Digital Integrated Circuits. Proc IEEE Eur Test Conf :307–316
17.
go back to reference Sunter SK, Nagi N (1997) A simplified polynomial-fitting algorithm for DAC and ADC BIST. Proc IEEE Int Test Conf :389–395 Sunter SK, Nagi N (1997) A simplified polynomial-fitting algorithm for DAC and ADC BIST. Proc IEEE Int Test Conf :389–395
18.
go back to reference Toner M, Roberts G (1993) A BIST scheme for an SNR test of a sigma-delta ADC. Proc Int Test Conf :805–814 Toner M, Roberts G (1993) A BIST scheme for an SNR test of a sigma-delta ADC. Proc Int Test Conf :805–814
19.
go back to reference Toner M, Roberts G (1994) A BIST Technique for a Frequency Response and Intermodulation Distortion Test of a Sigma-Delta ADC. Proc. IEEE VLSI Test Symp :60–65 Toner M, Roberts G (1994) A BIST Technique for a Frequency Response and Intermodulation Distortion Test of a Sigma-Delta ADC. Proc. IEEE VLSI Test Symp :60–65
Metadata
Title
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics
Authors
Vincent Kerzérho
Mariane Comte
Florence Azaïs
Philippe Cauvet
Serge Bernard
Michel Renovell
Publication date
01-06-2011
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 3/2011
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-011-5194-y

Other articles of this Issue 3/2011

Journal of Electronic Testing 3/2011 Go to the issue