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Journal of Electronic Testing
Published in: Journal of Electronic Testing 6/2016

08-12-2016

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 6/2016

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Excerpt

I am pleased to announce the 2015 JETTA-TTTC Best Paper Award. The award committee of the Test Technology Technical Council (TTTC) once again consisted of Matteo Sonza Reorda (Chair), Vishwani Agrawal, Salvador Mir, Adit Singh and Xiaoqing Wen. We congratulate the winning authors, Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey Jr., Thomas Moon, Xian Wang, Hyun Choi and Abhijit Chatterjee. Their paper, “Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware,” appeared in the Journal of Electronic Testing: Theory and Applications, Volume 31, Number 1, pp. 85–98, February 2015. The research reported in the paper was performed at the Georgia Institute of Technology, Atlanta, Georgia, USA. See the award announcement pages in this issue. …
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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
08-12-2016
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 6/2016
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-016-5629-6

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