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Journal of Electronic Testing
Published in: Journal of Electronic Testing 6/2016

11-11-2016

Four-Port Network Parameters Extraction Method for Partially Depleted SOI with Body-Contact Structure

Authors: Jun Liu, Yu Ping Huang, Kai Lu

Published in: Journal of Electronic Testing | Issue 6/2016

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Abstract

This work presents a model parameter extraction method based on four-port network for RF SOI MOSFET modeling. The gate, drain, source and body terminals are served as four separate ports. Four-port measurement simplifies the determination of small-signal equivalent circuit model elements such as parameters related to the body terminal which become clear in the equivalent circuit analysis. The extraction method of the RF SOI MOSFET extrinsic parasitic elements was also presented. The accuracy of the model extraction was verified by measurement and simulation from 100 MHz to 20 GHz.
previous article A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs

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Literature
1.
Brinkhoff J, Rustagi SC, Shi J, Lin F (2007) MOSFET model extraction using 50 GHz four-port measurements. In: Proc. IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, pp 647–650
2.
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Lee BJ, Kim K, Yu CG et al (2005) Effects of gate structures on the RF performance in PD SOI MOSFETs. IEEE Microwave Wireless Compon Lett 15(4):223–225
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Wu SD, Huang GW, Cheng LP, Wen SY, Chang CY (2003) Characterization of 2-port configuration MOSFETs amplifiers by 4-port measurement. In: Proc. Asia-Pacific Microwave Conf, vol. 3, pp 1431–1433
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Yang MT, Ho PPC, Wang YJ, Yeh TJ, Chia YT (2003) Broadband small-signal model and parameter extraction for deep sub-micron MOSFETs valid up to 110 GHz. In: Proc. IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, pp 369–372
Metadata
Title
Four-Port Network Parameters Extraction Method for Partially Depleted SOI with Body-Contact Structure
Authors
Jun Liu
Yu Ping Huang
Kai Lu
Publication date
11-11-2016
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 6/2016
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-016-5625-x

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