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Journal of Electronic Testing
Published in: Journal of Electronic Testing 4/2013

01-08-2013

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 4/2013

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Excerpt

The first three papers in this issue complete our Special Issue on Defect and Fault Tolerance, put together by Guest Editors, Prashant Joshi and Massimo Violante. The complete set contains 16 papers, of which the first 13 appeared in the last issue of JETTA (volume 29, number 3, June 2013). That issue also contains a Guest Editorial. …
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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
01-08-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 4/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5402-z

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