Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 1/2012

01-01-2012

Effect of intermetallic compounds on fracture behaviors of Sn3.0Ag0.5Cu lead-free solder joints during in situ tensile test

Authors: Yanhong Tian, Wei Liu, Rong An, Wei Zhang, Lina Niu, Chunqing Wang

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2012

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

In this paper, in situ tensile tests under various amounts of deformation were performed on Sn3.0Ag0.5Cu lead-free solder joints subjected to multi-reflow and isothermal aging processes by using a scanning electron microscope. Microstructure evolution and deformation behavior of the solder joints were observed. Effects of the intermetallic compound (IMC) Cu6Sn5 on fracture behaviors of the solder joints were investigated. Results showed that the Sn3.0Ag0.5Cu lead-free solder joints contained only a few Sn grains, and the sequence and degree of plastic deformation varied for the different grains in the same solder joint due to the strong anisotropic properties of Sn grains. Further experiments revealed that plastic deformation occured primarily in the form of slip bands in the solder joints during the in situ tensile test. Various fracture modes including intergranular and phase boundary fractures were observed. The fracture behaviors of solder joints were significantly affected by morphologies and distributions of the Cu6Sn5 IMCs. It was found that Cu6Sn5 particles located at the grain boundaries are apt to become crack sources, and that the long rod shaped Cu6Sn5 were easily broken. However, spherical Cu6Sn5 hardly deformed during the tensile test, resulting in dynamic recrystallization. In this case, fracture occured at the sub-grain boundaries.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference K. Zeng, K.N. Tu, Mater. Sci. Eng. R 38, 55 (2002) K. Zeng, K.N. Tu, Mater. Sci. Eng. R 38, 55 (2002)
2.
go back to reference K. Sakuma, P.S. Andry, C.K. Tsang, S.L. Wright, IBM J. Res. Dev. 52, 611 (2008)CrossRef K. Sakuma, P.S. Andry, C.K. Tsang, S.L. Wright, IBM J. Res. Dev. 52, 611 (2008)CrossRef
3.
go back to reference S.K. Seo, S.K. Kang, M.G. Cho, D.Y. Shin, H.M. Lee, J. Electr. Mater. 38, 2461 (2009) S.K. Seo, S.K. Kang, M.G. Cho, D.Y. Shin, H.M. Lee, J. Electr. Mater. 38, 2461 (2009)
5.
7.
8.
9.
10.
11.
12.
13.
go back to reference A.U. Telang, T.R. Bieler, JOM. 6, 44 (2005) A.U. Telang, T.R. Bieler, JOM. 6, 44 (2005)
14.
go back to reference Y. Ding, C.Q. Wang, Y.H. Tian, Metallur. Mater. Trans. A Phys. Metall. Mater. Sci. A 37, 1017 (2006)CrossRef Y. Ding, C.Q. Wang, Y.H. Tian, Metallur. Mater. Trans. A Phys. Metall. Mater. Sci. A 37, 1017 (2006)CrossRef
15.
17.
go back to reference X.Y. Li, X.H. Yang, W.Z. Dui, Mech. Strength. 30, 024 (2008) X.Y. Li, X.H. Yang, W.Z. Dui, Mech. Strength. 30, 024 (2008)
18.
go back to reference D.G.. Kim, H.S. Jang, J.W. Kim, J. Mater. Sci. Mater. Electr. 16, 603 (2005) D.G.. Kim, H.S. Jang, J.W. Kim, J. Mater. Sci. Mater. Electr. 16, 603 (2005)
19.
go back to reference R. Kinyanjui, L.P. Lehman, L. Zavalij, E. Cotts, J. Mater. Res. 20, 2914 (2005)CrossRef R. Kinyanjui, L.P. Lehman, L. Zavalij, E. Cotts, J. Mater. Res. 20, 2914 (2005)CrossRef
22.
go back to reference J.J. Sundelin, S.T. Nurmib, T. K. Lepist¨o, Mater. Sci. Eng. A 474, 201 (2008) J.J. Sundelin, S.T. Nurmib, T. K. Lepist¨o, Mater. Sci. Eng. A 474, 201 (2008)
23.
go back to reference B. Zhou, T.R. Bieler, T.K. Lee, K.C. Liu, J. Electr. Mater. 39, 2669 (2010)CrossRef B. Zhou, T.R. Bieler, T.K. Lee, K.C. Liu, J. Electr. Mater. 39, 2669 (2010)CrossRef
24.
go back to reference A.U. Telang, T.R. Bieler, A. Zamiri, F. Pourboghrat, Acta Mater 55, 2265 (2007) A.U. Telang, T.R. Bieler, A. Zamiri, F. Pourboghrat, Acta Mater 55, 2265 (2007)
25.
go back to reference Y. Sun, J. Liang, Z.H. Xu, G.F. Wang, X.D. Li, J. Mater. Sci. Mater. Electr. 19, 514 (2008)CrossRef Y. Sun, J. Liang, Z.H. Xu, G.F. Wang, X.D. Li, J. Mater. Sci. Mater. Electr. 19, 514 (2008)CrossRef
Metadata
Title
Effect of intermetallic compounds on fracture behaviors of Sn3.0Ag0.5Cu lead-free solder joints during in situ tensile test
Authors
Yanhong Tian
Wei Liu
Rong An
Wei Zhang
Lina Niu
Chunqing Wang
Publication date
01-01-2012
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2012
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-011-0538-z

Other articles of this Issue 1/2012

Journal of Materials Science: Materials in Electronics 1/2012 Go to the issue