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Journal of Electronic Materials
Published in: Journal of Electronic Materials 1/2024

07-11-2023 | Original Research Article

Effect of Nickel (Ni) Ion Doping on the Morphology and Supercapacitive Performance of Mn3O4 Thin Films

Authors: Tanaji S. Patil, V. P. Kothavale, V. P. Malekar, R. S. Kamble, R. B. Patil, K. V. Gurav, M. V. Takale, S. A. Gangawane

Published in: Journal of Electronic Materials | Issue 1/2024

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Abstract

We report the effect of nickel (Ni) ion doping on the structure, morphology, and supercapacitive performance of Mn3O4 thin film electrodes, deposited by a simple electrophoretic deposition technique. The structural and compositional studies of these thin films were conducted by x-ray diffraction and Fourier transform infrared spectroscopy. The morphological and optical properties were investigated by scanning electron microscopy, transmission electron microscopy, and UV–visible spectroscopy. These studies confirmed the nanoflake-type surface morphology of nickel-doped thin films. X-ray photoelectron spectroscopy provided information about various valence states and surface composition of the thin films. Cyclic voltammetry study confirmed the surface redox pseudocapacitive behavior of all thin films. The 2 mol.% nickel ion-doped thin film electrode displayed the highest specific capacitance of 816 F g−1 and was evaluated from the galvanostatic charge/discharge curve. It also exhibited outstanding cyclic stability, with 93% capacitance retention after 2000 cycles. Electrochemical impedance spectroscopy revealed the improved supercapacitive performance of the nickel-doped Mn3O4 thin film electrodes, attributed to improved conductivity and charge transport for surface redox reactions. Thus, the present study suggests that the nickel-doped Mn3O4 thin film is a promising candidate as electrode material in supercapacitors.

Graphical Abstract

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Metadata
Title
Effect of Nickel (Ni) Ion Doping on the Morphology and Supercapacitive Performance of Mn3O4 Thin Films
Authors
Tanaji S. Patil
V. P. Kothavale
V. P. Malekar
R. S. Kamble
R. B. Patil
K. V. Gurav
M. V. Takale
S. A. Gangawane
Publication date
07-11-2023
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 1/2024
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-023-10765-4

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