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Published in: Journal of Materials Science: Materials in Electronics 4/2018

15-11-2017

Effective chemical route for the synthesis of thiophenol stabilized cadmium sulphide (CdS) quantum dots: compact discussions on the structural, morphological, optical and dielectric properties

Authors: S. Muniyappan, T. Solaiyammal, K. Sudhakar, S. Nandhini, P. Murugakoothan

Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2018

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Abstract

This article describes the synthesis of CdS quantum dots by conventional chemical precipitation technique using thiophenol as a stabilizer. Structural information, crystallite size, lattice strain and dislocation density were determined by powder XRD analysis. FTIR analysis confirms the functional groups present in the synthesized CdS nanoparticles. FESEM and TEM analyses were used to investigate the morphology, particle size, phase identification and particle size distribution of the CdS nanoparticles. EDX analysis gives the elemental composition of the title compound. UV–vis-NIR reflectance spectroscopy brings out the nano-regime nature and bandgap of the resultant CdS product. Photoluminescence analysis describes the various emission properties of CdS quantum dots. The emission spectrum was analyzed through Commission International de I’Eclairage (CIE) 1931 chromaticity diagram to explore the dominant emission from the CdS quantum dots. DLS analysis gives out the information regarding secondary particle size of CdS nanoparticles. Dielectric study gives the relation between the dielectric constant and frequency for various temperatures. This work may help to develop a better understanding of solution growth mechanism and stabilizing nature of nanoparticles through chemical synthesis technique. The CdS nanoparticles are useful for the photovoltaic device applications.

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Metadata
Title
Effective chemical route for the synthesis of thiophenol stabilized cadmium sulphide (CdS) quantum dots: compact discussions on the structural, morphological, optical and dielectric properties
Authors
S. Muniyappan
T. Solaiyammal
K. Sudhakar
S. Nandhini
P. Murugakoothan
Publication date
15-11-2017
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 4/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-8220-8

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