1984 | OriginalPaper | Chapter
Empirical Formula for Sputtering Yield and Z2 Dependence of Its Q Values
Authors : Y. Yamamura, S. Nakagawa, S. Enoki
Published in: Secondary Ion Mass Spectrometry SIMS IV
Publisher: Springer Berlin Heidelberg
Included in: Professional Book Archive
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Preliminary estimations of sputtering yields for various ion-atom combinations are very important for SIMS and PWI problems. Recently, Yamamura et al.[1] have proposed the empirical formula for sputtering yield at normal incidence. Their formula includes two adjustable parameters, which correspond to Sigmund α and the threshold energy of sputtering. These two parameters were determined by the least square method so as to fit their formula to experimental data. The best-fit values of α show the interesting Z2 dependence and they factorized α into two parts, i.e., α = Q(Z2) αII , where αII is the average value of best-fit α’s. The main purpose of this note is to investigate this Z2 dependence of Q value from the viewpoint of nuclear stopping power of low-energy recoil atom.