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Published in: Microsystem Technologies 8-9/2010

01-08-2010 | Technical Paper

Fabrication of X-rays mask with carbon membrane for diffraction gratings

Authors: Naoki Takahashi, Hiroshi Tujii, Megumi Katori, Kenji Yamashita, Daiji Noda, Tadashi Hattori

Published in: Microsystem Technologies | Issue 8-9/2010

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Abstract

We have produced diffraction gratings for obtaining high resolution X-ray phase imaging, such as X-ray Talbot interferometer. These diffraction gratings were required to have a fine, high accuracy, high aspect ratio structure. Therefore, we decided to use the X-rays lithography technique that used synchrotron radiation of the directivity for a manufacture process. The accuracy of the completed structure depends largely on the accuracy of the X-ray mask. In our group, a resin material is conventionally used for the membrane of large X-ray masks. However, X-ray masks comprising a resin membrane have the disadvantage that, after several cycles of X-ray exposure, they crease and sag due to X-ray-derived heat. As a substitute for the conventional resin membrane, we experimentally fabricated a new X-ray mask using a carbon wafer membrane. The newly fabricated X-ray mask was subjected to X-ray exposure experiment. We succeeded in making the structure body which was almost shape. And the experimental results verified that the new mask did not deteriorate even when used repeatedly, demonstrating that it was highly durable.

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Literature
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Metadata
Title
Fabrication of X-rays mask with carbon membrane for diffraction gratings
Authors
Naoki Takahashi
Hiroshi Tujii
Megumi Katori
Kenji Yamashita
Daiji Noda
Tadashi Hattori
Publication date
01-08-2010
Publisher
Springer-Verlag
Published in
Microsystem Technologies / Issue 8-9/2010
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-010-1065-1

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