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Published in: Microsystem Technologies 8-9/2010

01-08-2010 | Technical Paper

Polyimide-based X-ray masks with advanced performance of pattern accuracy and thermal stability

Authors: Seichin Kinuta, Yoshiaki Saita, Masashi Kobayashi, Martin Boerner, Volker Saile, Sumio Hosaka

Published in: Microsystem Technologies | Issue 8-9/2010

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Abstract

Polyimide-based X-ray masks which are generated by optical lithography and electroplating of gold absorbers on a polyimide mask membrane gain attention as low cost masks. The organic membranes generally have problem of (1) pattern edge sharpness, (2) miniaturization of pattern and (3) thermal stability. To make the masks commodity in deep and accurate lithography area, Optnics Precision, Japan, has overcome the above difficulties and realized the masks with advanced performance of pattern accuracy and thermal stability by improving the making process and the material. Good results were obtained in the exposure experiment that used this mask. When this X-ray mask is combined with the electroforming technique and the material development technique that Optnics has, the application to various fields like an industrial field and medical field can be expected.

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Literature
go back to reference Achenbach S, Boerner M et al (2007) Structure quality in deep X-ray lithography applying commercial poliimide-based masks. Microsyst Technol 13:349–353CrossRef Achenbach S, Boerner M et al (2007) Structure quality in deep X-ray lithography applying commercial poliimide-based masks. Microsyst Technol 13:349–353CrossRef
Metadata
Title
Polyimide-based X-ray masks with advanced performance of pattern accuracy and thermal stability
Authors
Seichin Kinuta
Yoshiaki Saita
Masashi Kobayashi
Martin Boerner
Volker Saile
Sumio Hosaka
Publication date
01-08-2010
Publisher
Springer-Verlag
Published in
Microsystem Technologies / Issue 8-9/2010
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-010-1098-5

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