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Published in: Journal of Materials Science: Materials in Electronics 11/2014

01-11-2014

Greatly reduced leakage current and defect mechanism in atmosphere sintered BiFeO3–BaTiO3 high temperature piezoceramics

Authors: Zhonghua Yao, Chaobing Xu, Hanxing Liu, Hua Hao, Minghe Cao, Zhijian Wang, Zhe Song, Wei Hu, Atta Ullah

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2014

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Abstract

In current work, the effect of sintering atmospheres (N2, air and O2) on the structure, electrical properties, and defect mechanism of 0.8BiFeO3–0.2BaTiO3 lead-free piezoelectric ceramics has been investigated. X-ray diffractometer results indicated all the samples crystallized into the rhombohedrally distorted perovskite structure which was independent on the sintering atmospheres. Bi-containing impurity phases were observed in N2 sintered samples while not appearing in other atmospheres. X-ray photoelectron spectrum analysis indicated more Fe2+ ions, which can result in high leakage current, were involved in N2 sintered ceramics than that in O2- and air sintered compositions. However, greatly reduced leakage currents were obtained in N2 sintered ceramics which should be ascribed to the formation of secondary phases. The largest polarization and lowest leakage current were obtained in the sample sintered in N2 (2 h), which owned the optimal ferroelectric, piezoelectric, and electromechanical properties with piezoelectric constant d 33 = 98 pC/N, planar electromechanical coupling factors k p = 26.1 %, remnant polarization P r = 25.7 µC/cm2, coercive field E c = 74.6 kV/cm, and a high Curie temperature T c = 632 °C, respectively.

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Metadata
Title
Greatly reduced leakage current and defect mechanism in atmosphere sintered BiFeO3–BaTiO3 high temperature piezoceramics
Authors
Zhonghua Yao
Chaobing Xu
Hanxing Liu
Hua Hao
Minghe Cao
Zhijian Wang
Zhe Song
Wei Hu
Atta Ullah
Publication date
01-11-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2260-0

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