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Published in: Journal of Materials Science: Materials in Electronics 11/2024

01-04-2024

Impact of structural, electrical and magnetic features due to paramagnetic gd3+ ion doping on thea-site of lafeo3 solid solution

Authors: Nabasmita Saikia, R. L. Hota, R. K. Parida, B. N. Parida

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2024

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Abstract

This work involves the typical solid solution route for the synthesis of the Gd-modified LaFeO3-based perovskite, (La0.25Gd0.75)FeO3, followed by a comprehensive investigation of its structural, dielectrical, electrical, and magnetic properties. The material exhibits an orthorhombic crystal symmetry, according to a primary structural analysis using X-ray diffraction. The field emission scanning electron microscopy technique is carried out to investigate the sample’s surface morphology. The elemental constituents or the valency of the entailed elements are examined via X-ray photoelectron spectroscopic process. Applying Raman and Fourier transform infrared spectroscopic methods, multiple kinds of modes plus functional groups related to the sample are discussed. In the lower frequency domain, a noticeably high-dielectric constant value is observed at room temperature. Impedance spectroscopy reveals that the sample has a negative temperature coefficient of resistance and a non-Debye type of relaxation. Nyquist plots have been used to examine the role of grain and grain boundary effect in the conduction mechanism. Additionally, AC or DC conductivity spectra are explored thoroughly which provides knowledge regarding the kind of involved charge carriers. The Vibrational Sample Magnetometer analysis reveals that the sample exhibits weak ferromagnetic behaviour at room temperature (300 K).

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Metadata
Title
Impact of structural, electrical and magnetic features due to paramagnetic gd3+ ion doping on thea-site of lafeo3 solid solution
Authors
Nabasmita Saikia
R. L. Hota
R. K. Parida
B. N. Parida
Publication date
01-04-2024
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2024
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-024-12471-1

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