Influence of Alkali Metals on the Negative Secondary Ion Emission from Silicon | springerprofessional.de

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1984 | OriginalPaper | Chapter

Influence of Alkali Metals on the Negative Secondary Ion Emission from Silicon

Authors : W. Frentrup, M. Griepentrog, H. Klose, G. Kreysch, U. Mueller-Jahreis

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

Included in: Professional Book Archive

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The utility of ion implantation to investigate the influence of reactive ions on the secondary ion emission has been demonstrated by COLLIGON and KIRIAKIDES [1] in the case of copper matrix material.

previous chapter The Effect of Energetic Electrons on the Secondary Ion Emission

next chapter Secondary Ion Emission Peculiarities at Metal Interfaces

Title: Influence of Alkali Metals on the Negative Secondary Ion Emission from Silicon
Authors: W. Frentrup
M. Griepentrog
H. Klose
G. Kreysch
U. Mueller-Jahreis
Publisher: Springer Berlin Heidelberg
Book: Secondary Ion Mass Spectrometry SIMS IV
Print ISBN: 978-3-642-82258-2

Electronic ISBN: 978-3-642-82256-8

Copyright Year: 1984
DOI: https://doi.org/10.1007/978-3-642-82256-8_12