Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Published in:
Fundamentals of Sputtering Read chapter Read first chapter

1984 | OriginalPaper | Chapter

Secondary Ion Emission Peculiarities at Metal Interfaces

Authors : M. A. Vasilyev, S. P. Chenakin

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

Included in: Professional Book Archive

Get Access

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Specific physical and chemical states of interfaces are known to affect substantially the parameters of emission processes. Therefore it is of interest to investigate peculiarities of such a surface-sensitive phenomenon as the secondary ion emission (SIE) on the boundary of different metal phases. The present work deals with the study of thin metal film - metal substrate interfaces.

previous chapter Influence of Alkali Metals on the Negative Secondary Ion Emission from Silicon
next chapter Intensities and Energy Spectra of Secondary Ions Sputtered from Fe-Al Alloys by Ar+ Ion Bombardment in Ultrahigh Vacuum
Metadata
Title
Secondary Ion Emission Peculiarities at Metal Interfaces
Authors
M. A. Vasilyev
S. P. Chenakin
Copyright Year
1984
Publisher
Springer Berlin Heidelberg
Book
Secondary Ion Mass Spectrometry SIMS IV

Print ISBN: 978-3-642-82258-2

Electronic ISBN: 978-3-642-82256-8

Copyright Year: 1984

DOI
https://doi.org/10.1007/978-3-642-82256-8_13