Skip to main content
Top

Journal of Electronic Materials

Issue 11/2012

Content (37 Articles)

Plastic Flow and Dislocation Compensation in ZnS y Se1−y /GaAs (001) Heterostructures

T. Kujofsa, W. Yu, S. Cheruku, B. Outlaw, S. Xhurxhi, F. Obst, D. Sidoti, B. Bertoli, P.B. Rago, E.N. Suarez, F.C. Jain, J.E. Ayers

Critical Thickness of ZnTe on GaSb(211)B

J. Chai, O. C. Noriega, J. H. Dinan, T. H. Myers

Thermally Oxidized InAlN of Different Compositions for InAlN/GaN Heterostructure Field-Effect Transistors

P. Kordoš, M. Mikulics, R. Stoklas, K. Čičo, A. Dadgar, D. Grűtzmacher, A. Krost

Electrical and Optical Characterization of Ni/Al0.3Ga0.7N/GaN Schottky Barrier Diodes

P. Kordoš, J. Škriniarová, A. Chvála, M. Florovič, J. Kováč, D. Donoval

Irradiation-Induced Defects in Cd0.9Zn0.1Te:Al

Ruihua Nan, Wanqi Jie, Gangqiang Zha, Bei Wang, Yadong Xu, Hui Yu

Enhancing the Stability of CuO Thin-Film Photoelectrodes by Ti Alloying

Houwen Tang, M. A. Matin, Heli Wang, Shet Sudhakar, Le Chen, Mowafak M. Al-Jassim, Yanfa Yan

Thermoelectric Properties of Dy-Doped SrTiO3 Ceramics

J. Liu, C.L. Wang, H. Peng, W.B. Su, H.C. Wang, J.C. Li, J.L. Zhang, L.M. Mei

Electrical Properties of Textured (KNa)0.44Li0.06Nb0.84Sb0.06Ta0.1O3 Thick Films

Fang Fu, Jiwei Zhai, Zhengkui Xu, Wangfeng Bai, Lingbing Kong

TiO2 Coating for SnO2:F Films Produced by Filtered Cathodic Arc Evaporation for Improved Resistance to H+ Radical Exposure

M. M. Ristova, A. Gligorova, I. Nasov, D. Gracin, M. Milun, H. Kostadinova-Boskova, R. Popeski-Dimovski

Synthesis and Characterization of Magnesium-Alloyed Hematite Thin Films

Houwen Tang, M. A. Matin, Heli Wang, Mowafak Al-Jassim, John Turner, Yanfa Yan

Bowing Character in Wurtzite ZnO-Based Ternary Alloys

Nacir Tit, Sawsan Dagher, Ahmad Ayesh, Yousef Haik

Multiwavelength Micro-Raman Characterization of Epitaxial Si1−x Ge x Layers on Si(100) and In-Line Process Monitoring Applications

Chun-Wei Chang, Min-Hao Hong, Ming-Shan Tsai, Kuan-Ching Lee, Wei-Fan Lee, Yen Chuang, Yu-Ta Fan, Takeshi Ueda, Toshikazu Ishigaki, Kitaek Kang, Woo Sik Yoo

Crystal Structure and Morphology of Nanocrystalline TiN Thin Films

C. V. Ramana, S. White, N. Esparza, V. Rangel, A. L. Campbell

Transient Thermal Impedance Measurements on Low-Temperature-Sintered Nanoscale Silver Joints

Yunhui Mei, Tao Wang, Xiao Cao, Gang Chen, Guo-Quan Lu, Xu Chen

Effect of Hold Time on Crack Growth Behavior of Pb-Containing and Pb-Free Solders

Kittichai Fakpan, Yuichi Otsuka, Yoshiharu Mutoh, Kohsoku Nagata

Effects of Annealing Twins on the Grain Growth and Mechanical Properties of Ag-8Au-3Pd Bonding Wires

Tung-Han Chuang, Chih-Hsin Tsai, Hsi-Ching Wang, Che-Cheng Chang, Chien-Hsun Chuang, Jun-Der Lee, Hsing-Hua Tsai

Erratum

Erratum to: Controlling n-Type Carrier Density from Er Doping of InGaAs with MBE Growth Temperature

Peter G. Burke, Trevor E. Buehl, Gilles Pernot, Hong Lu, Ali Shakouri, Chris J. Palmstrom, John E. Bowers, Arthur C. Gossard