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2015 | OriginalPaper | Chapter

4. Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Authors : Da Luo, Hao Sun, Yan Li

Published in: Surface Science Tools for Nanomaterials Characterization

Publisher: Springer Berlin Heidelberg

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Abstract

Kelvin probe force microscopy (KPFM) is applicable to measure surface potential and work function in a localized nanoscale surface area. In this chapter, we describe the theory and measurement of KPFM and its applications in the characterization of inorganic nanostructure and nanomaterials.

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previous chapter Scanning Probe Microscopy for Nanolithography

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Title: Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
Authors: Da Luo
Hao Sun
Yan Li
Publisher: Springer Berlin Heidelberg
Book: Surface Science Tools for Nanomaterials Characterization
Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright Year: 2015
DOI: https://doi.org/10.1007/978-3-662-44551-8_4

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