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Published in: Journal of Materials Science: Materials in Electronics 23/2020

13-10-2020

Luminescence properties of PrF3-doped Sb2O3–ZnO–GeO2 glass phosphors for near-infrared wideband light-source

Authors: Seiya Nishimura, Echika Isobe, Yasushi Nanai, Shinji Koh, Shingo Fuchi

Published in: Journal of Materials Science: Materials in Electronics | Issue 23/2020

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Abstract

We synthesized PrF3-doped glass phosphors using a melt-quenching method and investigated the luminescence characteristic aiming at a new near-infrared wideband light-source. Optical activation of Pr3+ ions in the samples was confirmed by absorption spectra measurements. Broad PL spectra from 700 to 1100 nm with four PL peaks 730, 870, 930, and 1040 nm were observed by blue LED excitation in all samples. The observed PL peaks were attributed to 3P0 → 3F4, 1D2 → 3F2, 3P0 → 1G4, and 1D2 → 3F4 transitions of Pr3+ ions. With the increase in the PrF3 concentration, the integrated PL intensity around 1040 nm (1D2 → 3F4) was sharply decreased compared to the other PL peaks. We investigated the contribution of self-absorption and cross-relaxation phenomena to the spectral change by measuring glass thickness dependence of the PL spectra and measuring the PrF3 concentration dependence of the fluorescence lifetimes. The fluorescence lifetime of the PL peak at 1040 nm decreased with increasing PrF3 concentration owing to a non-radiative relaxation pathway stemming from the cross-relaxation phenomena. We found that the cross-relaxation phenomenon is a dominant factor in the luminescence properties of PrF3-doped glass phosphors.

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Metadata
Title
Luminescence properties of PrF3-doped Sb2O3–ZnO–GeO2 glass phosphors for near-infrared wideband light-source
Authors
Seiya Nishimura
Echika Isobe
Yasushi Nanai
Shinji Koh
Shingo Fuchi
Publication date
13-10-2020
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 23/2020
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-04595-x

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