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Published in: Journal of Materials Science: Materials in Electronics 23/2020

22-10-2020

Structural, optical, and mechanical properties of gamma beam-irradiated pure and CeCl3-doped potassium hydrogen phthalate (KHP) crystals for scintillating applications

Authors: C. Saravanan, M. Haris, M. Senthilkumar, V. Mathivanan

Published in: Journal of Materials Science: Materials in Electronics | Issue 23/2020

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Abstract

Potassium hydrogen phthalate (KHP) is a high-energy scintillating material having superior properties. The solution crystal growth technique at room temperature is employed for growing undoped and CeCl3-doped KHP crystals. The 60Co γ-ray-irradiated crystals were analyzed through powder X-ray diffraction analysis to evaluate the cell parameters of the pure and doped KHP crystals. The functional groups and vibration modes were identified by Fourier transform infrared spectral analysis. The optical transparency of the grown crystals was analyzed by UV–vis spectroscopy which shows less absorption in the CeCl3-doped KHP crystals when compared to pure KHP. The vibration properties were discussed with the use of Raman spectra of pure and doped crystals. The photoluminescence analysis reveals broad peaks from green to violet ranges for undoped and CeCl3-doped KHP crystals. The microhardness test was carried out at different applied loads varying in the range 25–100 g. It is revealed that the Vicker’s hardness values (Hv) increase with increasing applied load. The Meyer’s index number (n) is determined and it confirms that the gamma-irradiated pure, CeCl3-doped KHP crystals belong to the soft material category. The mechanical properties such as the elastic stiffness constant (C11), yield strength (σv), brittleness index (Bi), and the fracture toughness (Kc) are measured for both pure and 1–4 mol% CeCl3-doped KHP crystals.

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Metadata
Title
Structural, optical, and mechanical properties of gamma beam-irradiated pure and CeCl3-doped potassium hydrogen phthalate (KHP) crystals for scintillating applications
Authors
C. Saravanan
M. Haris
M. Senthilkumar
V. Mathivanan
Publication date
22-10-2020
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 23/2020
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-04649-0

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