Top

Published in:

2014 | OriginalPaper | Chapter

Mechanical Property Mapping at the Nanoscale Using PeakForce QNM Scanning Probe Technique

Authors : Bede Pittenger, Natalia Erina, Chanmin Su

Published in: Nanomechanical Analysis of High Performance Materials

Publisher: Springer Netherlands

Activate our intelligent search to find suitable subject content or patents.

search-config

AI-assisted search

Off

Abstract

Development of PeakForce QNM^® a new, powerful scanning probe microscopy (SPM) method for high resolution, nanoscale quantitative mapping of mechanical properties is described. Material properties such as elastic modulus, dissipation, adhesion, and deformation are mapped simultaneously with topography at real imaging speeds with nanoscale resolution. PeakForce QNM has several distinct advantages over other SPM based methods for nanomechanical characterization including ease of use, unambiguous and quantitative material information, non-destructive to both tip and sample, and fast acquisition times. This chapter discusses the theory and operating principles of PeakForce QNM and applications to measure mechanical properties of a variety of materials ranging from polymer blends and films to single crystals and even cement paste.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

über 102.000 Bücher
über 537 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Finance + Banking
Management + Führung
Marketing + Vertrieb
Maschinenbau + Werkstoffe
Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

über 67.000 Bücher
über 390 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Maschinenbau + Werkstoffe

Jetzt Wissensvorsprung sichern!

inform now

previous chapter Nanotribological Characterization of Polymeric Nanocoatings: From Fundamental to Application

next chapter Measurement of Hardness of Very Hard Materials

Cleveland JP, Anczykowski B, Schmid AE, Elings VB (1998) Energy dissipation in tapping-mode atomic force microscopy. Appl Phys Lett 72(20):2613–2615CrossRef

Dokukin ME, Sokolov I (2012) Quantitative mapping of the elastic modulus of soft materials with HarmoniX and PeakForce QNM AFM modes. Langmuir 28(46):16060–16071. doi:10.1021/la302706b CrossRef

Israelachvili N (1992) Intermolecular and surface forces Academic Press, New York

Legleiter J, Park M, Cusick B, Kowalewski T (2006) Scanning probe acceleration microscopy (SPAM) in fluids: Mapping mechanical properties of surfaces at the nanoscale. Proc Nat Acad Sci United States of Am 103(13):4813–4818. doi:10.1073/pnas.0505628103

Magonov S, Erina N (2005) Modern Trends in Atomic Force Microscopy of Polymers. Bruker application note AN84

Maugis D (2000) Contact, adhesion and rupture of elastic solids. Springer-Verlag, BerlinMATHCrossRef

Pittenger B, Erina N, Su C (2010) Quantitative Mechanical Property Mapping at the Nanoscale with Peak Force QNM. Bruker application note AN128

Proksch R (2006) Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy. Appl Phys Lett 89(11):113121–113123CrossRef

Radmacher M, Cleveland JP, Fritz M, Hansma HG and Hansma PK (1994) Mapping interaction forces with the atomic force microscope. Biophys J 66:2159–2165

Rode S, Oyabu N, Kobayashi K, Yamada H, Kühnle A (2009) True atomic-resolution Imaging of (1014) calcite in aqueous solution by frequency modulation atomic force microscopy. Langmuir 25(5):2850–2853. doi:10.1021/la803448v CrossRef

Rodriguez TR, Garcia R (2004) Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever. Appl Phys Lett 84(3):449–451CrossRef

Rosa-Zeiser A, Weilandt E, Hild S, Marti O (1997) The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation. Meas Sci Technol 8(11):1333CrossRef

Sahin O (2005) Harmonic force microscope: a new tool for biomolecular identification and material characterization based on nanomechanical Measurements. Stanford University

Sahin O (2007) Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements. Rev Sci Instrum 78(10):103707–103704CrossRef

Sahin O, Magonov S, Su C, Quate CF, Solgaard O (2007) An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nat Nanotechnol 2(8):507–514CrossRef

Sheiko SS, Sumerlin BS, Matyjaszewski K (2008) Cylindrical molecular brushes: Synthesis, characterization, and properties. Progress in Polymer Sci 33(7):759–785. doi:http://dx.doi.org/10.1016/j.progpolymsci.2008.05.001

Stark M, Stark RW, Heckl WM, Guckenberger R (2002) Inverting dynamic force microscopy: From signals to time-resolved interaction forces. Proc Nat Acad Sci 99(13):8473–8478. doi:10.1073/pnas.122040599

Tamayo J, Garcia R (1997) Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl Phys Lett 71(16):2394–2396CrossRef

Thoreson EJ, Martin J, Burnham NA (2006) The role of few-asperity contacts in adhesion. J Colloid Int Sci 298(1):94–101. doi:http://dx.doi.org/10.1016/j.jcis.2005.11.054

Trtik P, Kaufmann J, Volz U (2012) On the use of peak-force tapping atomic force microscopy for quantification of the local elastic modulus in hardened cement paste. Cem Concr Res 42(1):215–221. doi:http://dx.doi.org/10.1016/j.cemconres.2011.08.009

Veeco Application note #84

Veeco (2010) Quantitative mechanical property mapping at the nanoscale with PeakForce QNM

Young TJ, Monclus MA, Burnett TL, Broughton WR, Ogin SL, Smith PA (2011) The use of the PeakForce TM quantitative nanomechanical mapping AFM-based method for high-resolution Young’s modulus measurement of polymers. Meas Sci Technol 22(12):125703CrossRef

Zhong Q, Inniss D, Kjoller K, Elings VB (1993) Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf Sci Lett 290(1–2):L688–L692. doi:http://dx.doi.org/10.1016/0167-2584(93)90906-Y

Title: Mechanical Property Mapping at the Nanoscale Using PeakForce QNM Scanning Probe Technique
Authors: Bede Pittenger
Natalia Erina
Chanmin Su
Publisher: Springer Netherlands
Book: Nanomechanical Analysis of High Performance Materials
Print ISBN: 978-94-007-6918-2

Electronic ISBN: 978-94-007-6919-9

Copyright Year: 2014
DOI: https://doi.org/10.1007/978-94-007-6919-9_2

Springer Professional

Abstract

Please log in to get access to your license.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Springer Professional "Technik"

Premium Partners