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Erschienen in:

2014 | OriginalPaper | Buchkapitel

Mechanical Property Mapping at the Nanoscale Using PeakForce QNM Scanning Probe Technique

verfasst von : Bede Pittenger, Natalia Erina, Chanmin Su

Erschienen in: Nanomechanical Analysis of High Performance Materials

Verlag: Springer Netherlands

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Abstract

Development of PeakForce QNM^® a new, powerful scanning probe microscopy (SPM) method for high resolution, nanoscale quantitative mapping of mechanical properties is described. Material properties such as elastic modulus, dissipation, adhesion, and deformation are mapped simultaneously with topography at real imaging speeds with nanoscale resolution. PeakForce QNM has several distinct advantages over other SPM based methods for nanomechanical characterization including ease of use, unambiguous and quantitative material information, non-destructive to both tip and sample, and fast acquisition times. This chapter discusses the theory and operating principles of PeakForce QNM and applications to measure mechanical properties of a variety of materials ranging from polymer blends and films to single crystals and even cement paste.

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Vorheriges Kapitel Nanotribological Characterization of Polymeric Nanocoatings: From Fundamental to Application

Nächstes Kapitel Measurement of Hardness of Very Hard Materials

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Titel: Mechanical Property Mapping at the Nanoscale Using PeakForce QNM Scanning Probe Technique
verfasst von: Bede Pittenger
Natalia Erina
Chanmin Su
Verlag: Springer Netherlands
Buch: Nanomechanical Analysis of High Performance Materials
Print ISBN: 978-94-007-6918-2

Electronic ISBN: 978-94-007-6919-9

Copyright-Jahr: 2014
DOI: https://doi.org/10.1007/978-94-007-6919-9_2

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