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Published in: Journal of Materials Science: Materials in Electronics 11/2009

01-11-2009

Microstructure and microwave dielectric characteristics of CaO–B2O3–SiO2 glass ceramics

Authors: Haikui Zhu, Hongqing Zhou, Min Liu, Pengfei Wei, Guijun Xu, Ge Ning

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2009

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Abstract

CaO–B2O3–SiO2 (CBS) glass powders are prepared by traditional glass melting method, whose properties and microstructures are characterized by Differential thermal analysis (DTA), X-ray diffraction (XRD) and scanning electron microscopy (SEM). It is found that the pure CBS glass ceramics possess excellent dielectric properties (ε r = 6.5, tan δ = 5 × 10−3 at 10 GHz), but a higher sintering temperature (>900 °C) and a narrow sintering temperature range (about 10 °C). The addition of a low-melting-point CaO–B2O3–SiO2 glass (LG) could greatly decrease the sintering temperature of CBS glass to 820 °C and significantly enlarge the sintering temperature range to 40 °C. The CBS glass ceramic with 30 wt% LG glass addition sintered at 840 °C exhibits better dielectric properties: ε r ≈ 6, tan δ < 2 × 10−3 at 10 GHz, and the major phases of the sample are CaSiO3, CaB2O4 and SiO2.

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Metadata
Title
Microstructure and microwave dielectric characteristics of CaO–B2O3–SiO2 glass ceramics
Authors
Haikui Zhu
Hongqing Zhou
Min Liu
Pengfei Wei
Guijun Xu
Ge Ning
Publication date
01-11-2009
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2009
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-008-9839-2

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