Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 15/2017

09-04-2017

Microstructure, dielectric and nonlinear electrical properties associated with sintering conditions in calcium copper titanate ceramics

Authors: Y. Qiu, Z. J. Zou, L. H. Zhou, M. R. Bai, X. H. Li

Published in: Journal of Materials Science: Materials in Electronics | Issue 15/2017

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

A series of calcium copper titanate (CaCu3Ti4O12, CCTO) samples are prepared by a citric acid sol–gel method and the effect of sintering conditions on microstructure, dielectric and nonlinear electrical properties are investigated in detail. Systematical characterizations by both X-ray diffraction and Raman spectra identify the component phases of sintered products, verifying the formation of single phased CCTO if suitable sintering temperature and durations are selected. Well crystallized grains with the size of several microns are attained for the samples sintered at 1020 °C for 5 h, will make a contribution to giant dielectric behavior, evidenced by the highest value of dielectric constant (ε′ > 2.5 × 104) in the frequency range of 102 to 5 × 105 Hz. Dielectric spectroscopy measurements show similar dielectric dispersion for all the samples, which can be well interpreted by the interface polarization from grain boundaries and the bulk effect. Meanwhile, nonlinear electrical behaviors are observed for all the samples, attributing to the Schottky-like electrostatic barriers at the grain boundaries.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference M.A. Subramanian, D. Li, N. Duan, B.A. Reisner, A.W. Sleight, J. Solid State Chem. 151, 323 (2000)CrossRef M.A. Subramanian, D. Li, N. Duan, B.A. Reisner, A.W. Sleight, J. Solid State Chem. 151, 323 (2000)CrossRef
2.
go back to reference C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, A.P. Ramirez, Science 293, 673 (2001)CrossRef C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, A.P. Ramirez, Science 293, 673 (2001)CrossRef
4.
go back to reference D.C. Sinclair, T.B. Adams, F.D. Morrison, A.R. West, Appl. Phys. Lett. 80, 2153 (2002)CrossRef D.C. Sinclair, T.B. Adams, F.D. Morrison, A.R. West, Appl. Phys. Lett. 80, 2153 (2002)CrossRef
5.
go back to reference T. Li, R.Z. Xue, J.H. Hao, Y.C. Xue, Z.P. Chen, J. Alloys Compd. 509, 1025 (2011)CrossRef T. Li, R.Z. Xue, J.H. Hao, Y.C. Xue, Z.P. Chen, J. Alloys Compd. 509, 1025 (2011)CrossRef
6.
go back to reference Y. Qiu, S. L. Yuan, Z. M. Tian, L. Chen, C.H. Wang, H. N. Duan, K. Guo, Appl. Phys. A 107, 379 (2012)CrossRef Y. Qiu, S. L. Yuan, Z. M. Tian, L. Chen, C.H. Wang, H. N. Duan, K. Guo, Appl. Phys. A 107, 379 (2012)CrossRef
7.
go back to reference K. Tsuji, W.T. Chen, H.Z. Guo, W.H. Lee, S. Guillemet-Fritsch, C.A. Randall, J. Appl. Phys. 121, 064107 (2017)CrossRef K. Tsuji, W.T. Chen, H.Z. Guo, W.H. Lee, S. Guillemet-Fritsch, C.A. Randall, J. Appl. Phys. 121, 064107 (2017)CrossRef
9.
go back to reference Z. Li, P. Zhao, Z. Wang, X.H. Xue, Z.T. Li, H.Q. Fan, J. Mater. Sci. Mater. Electron. 27, 7327 (2016)CrossRef Z. Li, P. Zhao, Z. Wang, X.H. Xue, Z.T. Li, H.Q. Fan, J. Mater. Sci. Mater. Electron. 27, 7327 (2016)CrossRef
12.
go back to reference S. Mostafa Hosseinpour-Mashkani, M. Ramezani, A. Sobhani-Nasab, M. Esmaeili-Zare, J. Mater. Sci. Mater. Electron. 26, 6086 (2015)CrossRef S. Mostafa Hosseinpour-Mashkani, M. Ramezani, A. Sobhani-Nasab, M. Esmaeili-Zare, J. Mater. Sci. Mater. Electron. 26, 6086 (2015)CrossRef
13.
go back to reference J.Q. Wang, X. Huang, X.H. Zheng, D.P. Tang, J. Mater. Sci. Mater. Electron. 27, 1345 (2016)CrossRef J.Q. Wang, X. Huang, X.H. Zheng, D.P. Tang, J. Mater. Sci. Mater. Electron. 27, 1345 (2016)CrossRef
14.
go back to reference X.T. Zhao, L.L. Ren, R.J. Liao, J.Y. Li, L.J. Yang, F.P. Wang, J. Electron. Mater. 45, 3079, (2016)CrossRef X.T. Zhao, L.L. Ren, R.J. Liao, J.Y. Li, L.J. Yang, F.P. Wang, J. Electron. Mater. 45, 3079, (2016)CrossRef
15.
go back to reference N.I. Kadyrova, N.V. Mel’nikova, I.S. Ustinova, Y.G. Zainulin, Inorg. Mater. 52, 1051, (2016)CrossRef N.I. Kadyrova, N.V. Mel’nikova, I.S. Ustinova, Y.G. Zainulin, Inorg. Mater. 52, 1051, (2016)CrossRef
16.
go back to reference X.W. Wang, P.B. Jia, X.E. Wang, B.H. Zhang, L. Y. Sun, Q.B. Liu, J. Mater. Sci. Mater. Electron. 27, 12134 (2016)CrossRef X.W. Wang, P.B. Jia, X.E. Wang, B.H. Zhang, L. Y. Sun, Q.B. Liu, J. Mater. Sci. Mater. Electron. 27, 12134 (2016)CrossRef
17.
go back to reference D. Valim, A.G. Souza Filho, P.T.C. Freire, S.B. Fagan, A.P. Ayala, J. MendesFilho, A.F.L. Almeida, P.B.A. Fechine, A.S.B. Sombra, J.S. Olsen, L. Gerward, Phys. Rev. B 70, 132103 (2004)CrossRef D. Valim, A.G. Souza Filho, P.T.C. Freire, S.B. Fagan, A.P. Ayala, J. MendesFilho, A.F.L. Almeida, P.B.A. Fechine, A.S.B. Sombra, J.S. Olsen, L. Gerward, Phys. Rev. B 70, 132103 (2004)CrossRef
18.
go back to reference N. Kolev, R.P. Bontchev, A.J. Jacobson, V.N. Popov, V.G. Hadjiev, A.P. Litvinchuk, M.N. Iliev, Phys. Rev. B 66, 132102 (2002)CrossRef N. Kolev, R.P. Bontchev, A.J. Jacobson, V.N. Popov, V.G. Hadjiev, A.P. Litvinchuk, M.N. Iliev, Phys. Rev. B 66, 132102 (2002)CrossRef
19.
20.
22.
go back to reference A.K. Rai, N.K. Singh, S.K. Lee, K.D. Mandal, D. Kumar, O. Parkash, J. Alloys Compd. 509, 8901 (2011)CrossRef A.K. Rai, N.K. Singh, S.K. Lee, K.D. Mandal, D. Kumar, O. Parkash, J. Alloys Compd. 509, 8901 (2011)CrossRef
23.
go back to reference J.L. Zhang, P. Zheng, C.L. Wang, M.L. Zhao, J.C. Li, J.F. Wang, Appl. Phys. Lett. 87, 142901 (2005)CrossRef J.L. Zhang, P. Zheng, C.L. Wang, M.L. Zhao, J.C. Li, J.F. Wang, Appl. Phys. Lett. 87, 142901 (2005)CrossRef
24.
27.
29.
go back to reference Y. Qiu, Z.Z. Ma, S.X. Huo, H.N. Duan, Z.M. Tian, S.L. Yuan, L. Chen, J. Mater. Sci. Mater. Electron. 23, 1587 (2012)CrossRef Y. Qiu, Z.Z. Ma, S.X. Huo, H.N. Duan, Z.M. Tian, S.L. Yuan, L. Chen, J. Mater. Sci. Mater. Electron. 23, 1587 (2012)CrossRef
30.
go back to reference P. Thongbai, T. Yamwong, S. Maensiri, V. Amornkitbamrung, P. Chindaprasirt, J. Am. Ceram. Soc. 97, 1785 (2014)CrossRef P. Thongbai, T. Yamwong, S. Maensiri, V. Amornkitbamrung, P. Chindaprasirt, J. Am. Ceram. Soc. 97, 1785 (2014)CrossRef
Metadata
Title
Microstructure, dielectric and nonlinear electrical properties associated with sintering conditions in calcium copper titanate ceramics
Authors
Y. Qiu
Z. J. Zou
L. H. Zhou
M. R. Bai
X. H. Li
Publication date
09-04-2017
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 15/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-6894-6

Other articles of this Issue 15/2017

Journal of Materials Science: Materials in Electronics 15/2017 Go to the issue