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Published in: Journal of Materials Science: Materials in Electronics 7/2015

01-07-2015

Microstructures and microwave dielectric properties of (1 − x)Sr0.2Na0.4Sm0.4TiO3xLnAlO3 (Ln = Nd, Pr and Sm) ceramic systems

Authors: Jingjing Qu, Changlai Yuan, Fei Liu, Xinyu Liu, Guohua Chen, Panpan Qin

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2015

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Abstract

The microstructures and microwave dielectric properties of the (1 − x)Sr0.2Na0.4Sm0.4TiO3xLnAlO3 samples (where Ln stands for Nd, Pr and Sm, x = 0.2–0.3) were studied. The XRD result showed that the (1 − x)Sr0.2Na0.4Sm0.4TiO3xLnAlO3 (Ln = Nd, Pr and Sm) solid-solutions with single orthorhombic perovskite phase could be formed in the componential range of 0.2 ≤ x ≤ 0.3. With an increasing of Ln3+ content, the dielectric constant (ε r ) decreased due to the smaller dielectric polarizability of LnAlO3 than that of Sr0.2Na0.4Sm0.4TiO3. With increasing x from 0.2 to 0.3, the quality factor (Q·f) firstly increased and then decreased for the specimens with PrAlO3, because the Q·f values were strongly depended on grain sizes. Moreover, either increasing the A-site bond valence or decreasing the B-site bond valence led to a decrease in the temperature coefficient of the resonant frequency (τ f). Typical values of ε r ~ 52.7, Q·f ~ 9700 GHz (at 4.33 GHz) and τ f ~ 1.5 ppm/°C were obtained for the (1 − x)Sr0.2Na0.4Sm0.4TiO3xSmAlO3 (x = 0.25) ceramic sintered at 1470 °C for 4 h.

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Metadata
Title
Microstructures and microwave dielectric properties of (1 − x)Sr0.2Na0.4Sm0.4TiO3–xLnAlO3 (Ln = Nd, Pr and Sm) ceramic systems
Authors
Jingjing Qu
Changlai Yuan
Fei Liu
Xinyu Liu
Guohua Chen
Panpan Qin
Publication date
01-07-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 7/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-2994-3

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