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2001 | OriginalPaper | Chapter

Monte Carlo Impurity Diffusion Simulation Considering Charged Species

Authors : Masami Hane, Takeo Ikezawa, George H. Gilmert

Published in: Simulation of Semiconductor Processes and Devices 2001

Publisher: Springer Vienna

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A Monte Carlo dopant diffusion simulation program has been developed which includes charged species, i.e. Fermi-level effects on drift-diffusion and reactions. In order to save computational time, an algorithm that determines variable time steps was improved to account for all the Fermi-level dependent quantities, such as different charge states of point-defects, pairs and complexes, and different diffusivities/reaction rates for them. Simulation of coupled arsenic and boron diffusion for a typical sub-100nm CMOS process has been demonstrated by using this MC program.

Metadata
Title
Monte Carlo Impurity Diffusion Simulation Considering Charged Species
Authors
Masami Hane
Takeo Ikezawa
George H. Gilmert
Copyright Year
2001
Publisher
Springer Vienna
DOI
https://doi.org/10.1007/978-3-7091-6244-6_3