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Published in: Journal of Sol-Gel Science and Technology 1-2/2008

01-11-2008 | Original Paper

Multi-parameter evaluation of fast sol–gel process by terahertz measurements

Authors: Raz Gvishi, Avraham Englander, Gadi Peleg

Published in: Journal of Sol-Gel Science and Technology | Issue 1-2/2008

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Abstract

We present a feasibility study to apply terahertz (THz) spectroscopy and THz imaging as non-destructive diagnostic tools for sol–gel analysis, manufacturing and quality control. By performing THz spectroscopy on liquid and solid samples we were able to follow several key parameters during the sol–gel formation process and of the final product. Sol–gel transformations were monitored by THz absorption, whereas density changes have been observed through changes in refractive indices. Time domain spectroscopy (TDS), both in transmission and reflection geometries, was used to monitor the properties of fast sol–gel resins. THz imaging of gold coated, thin-film sol–gel enables us to determine inhomogeneities and defects in their internal structure. We demonstrated that THz spectroscopy can be implemented as an online analytical tool for multi-parameter evaluation of the sol–gel process during fabrication, and of the final product.

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Metadata
Title
Multi-parameter evaluation of fast sol–gel process by terahertz measurements
Authors
Raz Gvishi
Avraham Englander
Gadi Peleg
Publication date
01-11-2008
Publisher
Springer US
Published in
Journal of Sol-Gel Science and Technology / Issue 1-2/2008
Print ISSN: 0928-0707
Electronic ISSN: 1573-4846
DOI
https://doi.org/10.1007/s10971-008-1772-6

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