Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 9/2014

01-09-2014

Oxygen vacancy-related dielectric relaxation and electrical conductivity in La-doped Ba(Zr0.9Ti0.1)O3 ceramics

Authors: Shaoying Zheng, Danping Shi, Laijun Liu, Guizhong Li, Quanchao Wang, Liang Fang, Brahim Elouadi

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2014

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Ba1−xLax (Zr0.9Ti0.1)1−x/4O3 (BLZT) ceramics with x = 0.02 (BLZT-1), 0.04 (BLZT-2), 0.06 (BLZT-3) and 0.08 (BLZT-4) were prepared by a solid-state reaction route. Crystal structure of the BLZT ceramics was determined using X-ray diffraction and Raman spectroscopy. While the ceramics for x ≤ 0.04 are pure phase with cubic perovskite structure, pyrochlore La2Zr2O7 appears in the samples with x = 0.06 and 0.08. Dielectric properties as function of temperature and frequency showed more than one dielectric anomaly were found at high temperatures during heating but they weakened or disappeared during cooling. Both dielectric relaxation and electrical conductivity were taken into account in point defect mechanism. The double-ionized and short-range hopping of oxygen vacancy should be mainly responsible for the dielectric anomalies and conduction behavior. Activation energy of conductivity E con is lower than half of the band gap E g obtained by UV–Vis spectroscopy, which results from emergency of oxygen vacancies. In visible light region, the ceramics show a strong absorption with band gap of about 3.57 eV.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference S. Zheng, E. Odendo, L. Liu, D. Shi, Y. Huang, L. Fan, J. Chen, L. Fang, B. Elouadi, J. Appl. Phys. 113, 094102 (2013)CrossRef S. Zheng, E. Odendo, L. Liu, D. Shi, Y. Huang, L. Fan, J. Chen, L. Fang, B. Elouadi, J. Appl. Phys. 113, 094102 (2013)CrossRef
2.
go back to reference L.J. Liu, S.Y. Zheng, Y.M. Huang, D.P. Shi, S.S. Wu, L. Fang, C.Z. Hu, B. Elouadi, J. Phys. D Appl. Phys. 45, 295403 (2012)CrossRef L.J. Liu, S.Y. Zheng, Y.M. Huang, D.P. Shi, S.S. Wu, L. Fang, C.Z. Hu, B. Elouadi, J. Phys. D Appl. Phys. 45, 295403 (2012)CrossRef
3.
5.
go back to reference J.F. Ihlefeld, W.J. Borland, J.-P. Maria, Adv. Funct. Mater. 17, 1199 (2007)CrossRef J.F. Ihlefeld, W.J. Borland, J.-P. Maria, Adv. Funct. Mater. 17, 1199 (2007)CrossRef
6.
go back to reference G.C. Deng, G.R. Li, A.L. Ding, Q.R. Yin, Appl. Phys. Lett. 87, 192905 (2005)CrossRef G.C. Deng, G.R. Li, A.L. Ding, Q.R. Yin, Appl. Phys. Lett. 87, 192905 (2005)CrossRef
7.
go back to reference D.I. Woodward, I.M. Reaney, G.Y. Yang, E.C. Dickey, C.A. Randall, Appl. Phys. Lett. 84, 4650 (2004)CrossRef D.I. Woodward, I.M. Reaney, G.Y. Yang, E.C. Dickey, C.A. Randall, Appl. Phys. Lett. 84, 4650 (2004)CrossRef
8.
9.
10.
11.
go back to reference F.D. Morrison, D.C. Sinclair, A.R. West, J. App. Phys. 86, 6355–6366 (1999)CrossRef F.D. Morrison, D.C. Sinclair, A.R. West, J. App. Phys. 86, 6355–6366 (1999)CrossRef
12.
13.
go back to reference D. Makovec, Z. Samardzija, U. Delalut, D. Kolar, J. Am. Ceram. Soc. 78, 2193–2197 (1995)CrossRef D. Makovec, Z. Samardzija, U. Delalut, D. Kolar, J. Am. Ceram. Soc. 78, 2193–2197 (1995)CrossRef
14.
go back to reference F.D. Morrison, D.C. Sinclair, J.M.S. Skakle, A.R. West, J. Am. Ceram. Soc. 81, 1957–1960 (1998)CrossRef F.D. Morrison, D.C. Sinclair, J.M.S. Skakle, A.R. West, J. Am. Ceram. Soc. 81, 1957–1960 (1998)CrossRef
15.
18.
go back to reference F.D. Morrison, A.M. Coats, D.C. Sinclair, A.R. West, J. Electroceramics 6, 219–232 (2001)CrossRef F.D. Morrison, A.M. Coats, D.C. Sinclair, A.R. West, J. Electroceramics 6, 219–232 (2001)CrossRef
19.
go back to reference C.L. Freeman, J.A. Dawson, H.-R. Chen, L.-B. Ben, J.H. Harding, F.D. Morrison, D.C. Sinclair, A.R. West, Adv. Funct. Mater. 23, 3925–3928 (2013)CrossRef C.L. Freeman, J.A. Dawson, H.-R. Chen, L.-B. Ben, J.H. Harding, F.D. Morrison, D.C. Sinclair, A.R. West, Adv. Funct. Mater. 23, 3925–3928 (2013)CrossRef
20.
go back to reference C.L. Freeman, J.A. Dawson, J.H. Harding, L.-B. Ben, D.C. Sinclair, Adv. Funct. Mater. 23, 491–495 (2013)CrossRef C.L. Freeman, J.A. Dawson, J.H. Harding, L.-B. Ben, D.C. Sinclair, Adv. Funct. Mater. 23, 491–495 (2013)CrossRef
21.
go back to reference N.W. Thomas, J. Phys. Chem. Solids 51, 1419–1431 (1990) N.W. Thomas, J. Phys. Chem. Solids 51, 1419–1431 (1990)
23.
go back to reference A. Coelho, TOPAS-Academic V4. 1 (Coelho Software, Brisbane, 2007) A. Coelho, TOPAS-Academic V4. 1 (Coelho Software, Brisbane, 2007)
24.
go back to reference N.K. Karan, R.S. Katiyar, T. Maiti, R. Guo, A.S. Bhalla, J. Raman Spectrosc. 40, 370–375 (2009)CrossRef N.K. Karan, R.S. Katiyar, T. Maiti, R. Guo, A.S. Bhalla, J. Raman Spectrosc. 40, 370–375 (2009)CrossRef
25.
go back to reference S. Zheng, L. Fan, E. Odendo, L. Liu, D. Shi, G. Li, J. Chen, L. Fang, B. Elouadi, Curr. Appl. Phys. 14, 13–17 (2014)CrossRef S. Zheng, L. Fan, E. Odendo, L. Liu, D. Shi, G. Li, J. Chen, L. Fang, B. Elouadi, Curr. Appl. Phys. 14, 13–17 (2014)CrossRef
26.
27.
go back to reference L.J. Liu, Y.M. Huang, Y.H. Li, M.X. Wu, L. Fang, C.Z. Hu, Y.Z. Wang, Phys. B 407, 136–139 (2012)CrossRef L.J. Liu, Y.M. Huang, Y.H. Li, M.X. Wu, L. Fang, C.Z. Hu, Y.Z. Wang, Phys. B 407, 136–139 (2012)CrossRef
29.
33.
go back to reference S. Steinsvik, R. Bugge, J. Gjonnes, J. Phys. Chem. Solids 58, 969–976 (1997) S. Steinsvik, R. Bugge, J. Gjonnes, J. Phys. Chem. Solids 58, 969–976 (1997)
34.
35.
go back to reference A.K. Jonscher, Universal Relaxation Law (Chelsea Dielectrics Press, London, 1996) A.K. Jonscher, Universal Relaxation Law (Chelsea Dielectrics Press, London, 1996)
36.
go back to reference R.H. Chen, R.Y. Chang, S.C. Shern, J. Phys. Chem. Solids 63, 2069–2077 (2002) R.H. Chen, R.Y. Chang, S.C. Shern, J. Phys. Chem. Solids 63, 2069–2077 (2002)
37.
go back to reference A.D.S. Peláiz-Barranco, J. Guerra, R. López-Noda, E.B. Aráujo, J. Phys. D Appl. Phys. 41, 215503 (2008)CrossRef A.D.S. Peláiz-Barranco, J. Guerra, R. López-Noda, E.B. Aráujo, J. Phys. D Appl. Phys. 41, 215503 (2008)CrossRef
38.
40.
go back to reference R. Rawal, A. Feteira, A.A. Flores, N.C. Hyatt, A.R. West, D.C. Sinclair, J. Am. Ceram. Soc. 89, 336–339 (2006)CrossRef R. Rawal, A. Feteira, A.A. Flores, N.C. Hyatt, A.R. West, D.C. Sinclair, J. Am. Ceram. Soc. 89, 336–339 (2006)CrossRef
41.
go back to reference Q. Zhang, J. Zhai, Q. Ben, X. Yu, X. Yao, J. Appl. Phys. 112, 104104 (2012)CrossRef Q. Zhang, J. Zhai, Q. Ben, X. Yu, X. Yao, J. Appl. Phys. 112, 104104 (2012)CrossRef
Metadata
Title
Oxygen vacancy-related dielectric relaxation and electrical conductivity in La-doped Ba(Zr0.9Ti0.1)O3 ceramics
Authors
Shaoying Zheng
Danping Shi
Laijun Liu
Guizhong Li
Quanchao Wang
Liang Fang
Brahim Elouadi
Publication date
01-09-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2129-2

Other articles of this Issue 9/2014

Journal of Materials Science: Materials in Electronics 9/2014 Go to the issue