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2021 | OriginalPaper | Chapter

Performance Analysis of Ga0.47In0.53Sb-FinFET and Si-FinFET for RF and Low-Power Design Applications

Authors : Ankit Dixit, Dip Prakash Samajdar, Dheeraj Sharma

Published in: Computers and Devices for Communication

Publisher: Springer Singapore

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Abstract

In this paper, a tri-gate N-channel Ga0.47In0.53Sb-based FinFET is compared with conventional Si-based device for high-frequency applications. TCAD simulation tool is used to investigate the DC behavior of device for different bias voltages. Capacitative analysis is utilized to investigate the RF parameters such as intrinsic delay, power and energy dissipation, transconductance generation factor, and high cut-off frequency of the device. Si-FinFET exhibits better DC performance whereas Ga0.47In0.53Sb-FinFET excels in terms of RF performance factors such as lower gate delay, lesser power consumption, and energy dissipation with higher cut-off frequency. All these findings conclude that InGaSb-based FinFETs can serve as suitable candidates for novel nanoelectronic devices operating in the high-frequency regime.

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Metadata
Title
Performance Analysis of Ga0.47In0.53Sb-FinFET and Si-FinFET for RF and Low-Power Design Applications
Authors
Ankit Dixit
Dip Prakash Samajdar
Dheeraj Sharma
Copyright Year
2021
Publisher
Springer Singapore
DOI
https://doi.org/10.1007/978-981-15-8366-7_78