Skip to main content
Top
Published in: Microsystem Technologies 5/2019

10-10-2017 | Technical Paper

Power-aware sourse feedback single-ended 7T SRAM cell at nanoscale regime

Authors: Chandaramauleshwar Roy, Aminul Islam

Published in: Microsystem Technologies | Issue 5/2019

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This article presents a low power and highly stable source feedback SE7T (single-ended 7T) SRAM cell. Using Monte-Carlo simulations critical design metrics of proposed SE7T SRAM cell are estimated and the estimated results are compared with that of conventional 6T SRAM cell and conventional 7T SRAM cell (CONV7T). The proposed source feedback single Ended (SE7T) SRAM cell achieves 8.6 ×/12.5 × and 1.2 ×/5.3 × lower write power and hold power as compared to CONV6T/CONV7T respectively. The proposed bitcell takes 1.3 × longer but 1.3 × less Read Access Time (TRA) as compared to CONV6T and CONV7T at 200 mV respectively. The proposed bitcell also provides 1.67 × and 1.07 × higher read stability and write ability as compared to 6T SRAM Cell.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
go back to reference Feki A, Allard B, Turgis D, Lafont J, Ciampolini L (2012) Proposal of a new ultra low leakage 10T sub threshold SRAM bitcell. SoC Design Conference (ISOCC), 2012 International. IEEE, Jeju Island, South Korea, pp 470–474. doi:10.1109/ISOCC.2012.6406898 Feki A, Allard B, Turgis D, Lafont J, Ciampolini L (2012) Proposal of a new ultra low leakage 10T sub threshold SRAM bitcell. SoC Design Conference (ISOCC), 2012 International. IEEE, Jeju Island, South Korea, pp 470–474. doi:10.​1109/​ISOCC.​2012.​6406898
go back to reference Islam A, Hasan M (2011) Single-ended 6T SRAM cell to improve dynamic power dissipation by decreasing activity factor. Mediterr J Electron Commun 7(1):172–181MathSciNet Islam A, Hasan M (2011) Single-ended 6T SRAM cell to improve dynamic power dissipation by decreasing activity factor. Mediterr J Electron Commun 7(1):172–181MathSciNet
go back to reference Islam A, Hasan M, Arslan T (2012) Variation resilient subthreshold SRAM cell design technique. Int J Electron 99(9):1223–1237CrossRef Islam A, Hasan M, Arslan T (2012) Variation resilient subthreshold SRAM cell design technique. Int J Electron 99(9):1223–1237CrossRef
go back to reference Kariyappa BS, Madiwalar B, Palecha N (2013) A Comparative study of 7T SRAM cells. Int J Comput Trends Technol (IJCTT) 4(7):2188–2191 (ISSN 2231-2803) Kariyappa BS, Madiwalar B, Palecha N (2013) A Comparative study of 7T SRAM cells. Int J Comput Trends Technol (IJCTT) 4(7):2188–2191 (ISSN 2231-2803)
go back to reference Kulkarni JP, Kim K, Roy K (2007) A 160 mV robust Schmitt trigger based subthreshold SRAM”. IEEE J Solid State Circuits 42(10):2303–2313CrossRef Kulkarni JP, Kim K, Roy K (2007) A 160 mV robust Schmitt trigger based subthreshold SRAM”. IEEE J Solid State Circuits 42(10):2303–2313CrossRef
go back to reference Mohanty SP, Kougianos E (2011) PVT-tolerant 7-transistor SRAM optimization via polynomial regression. In: ISED ‘11 Proceedings of the 2011 International Symposium on Electronic System Design. IEEE, Kochi, Kerala, India, pp 39–44. doi:10.1109/ISED.2011.11 Mohanty SP, Kougianos E (2011) PVT-tolerant 7-transistor SRAM optimization via polynomial regression. In: ISED ‘11 Proceedings of the 2011 International Symposium on Electronic System Design. IEEE, Kochi, Kerala, India, pp 39–44. doi:10.​1109/​ISED.​2011.​11
go back to reference Nalam S, Calhoun BH (2009) Asymmetric sizing in a 45 nm 5T SRAM to improve read stability over 6T. In: Proceedings of the IEEE Custom Integrated Circuits Conference, CICC ‘09. San Jose, California, USA, pp 709–712 Nalam S, Calhoun BH (2009) Asymmetric sizing in a 45 nm 5T SRAM to improve read stability over 6T. In: Proceedings of the IEEE Custom Integrated Circuits Conference, CICC ‘09. San Jose, California, USA, pp 709–712
go back to reference Noguchi H et al (2008) Which is the best dual-port SRAM in 45-nm process technology? 8T, 10T single end, and 10T differential. In: IEEE International conference on integrated circuit design and technology (ICICDT), pp 55–58 Noguchi H et al (2008) Which is the best dual-port SRAM in 45-nm process technology? 8T, 10T single end, and 10T differential. In: IEEE International conference on integrated circuit design and technology (ICICDT), pp 55–58
go back to reference Ohbayashi S et al (2007) A 65-nm SoC embedded 6T-SRAM designed for manufacturability with read and write operation stabilizing circuits. IEEE J Solid State Circuits 42(4):820–829CrossRef Ohbayashi S et al (2007) A 65-nm SoC embedded 6T-SRAM designed for manufacturability with read and write operation stabilizing circuits. IEEE J Solid State Circuits 42(4):820–829CrossRef
go back to reference Pal S, Islam A (2016) Variation tolerant differential 8T SRAM cell for ultralow power applications. IEEE Trans Comput Aided Design Integr Circuits Syst 35(4):549–558CrossRef Pal S, Islam A (2016) Variation tolerant differential 8T SRAM cell for ultralow power applications. IEEE Trans Comput Aided Design Integr Circuits Syst 35(4):549–558CrossRef
go back to reference Teman A, Pergament L, Cohen O, Fish A (2011) A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM). IEEE J Solid State Circuits 46(11):2713–2726CrossRef Teman A, Pergament L, Cohen O, Fish A (2011) A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM). IEEE J Solid State Circuits 46(11):2713–2726CrossRef
Metadata
Title
Power-aware sourse feedback single-ended 7T SRAM cell at nanoscale regime
Authors
Chandaramauleshwar Roy
Aminul Islam
Publication date
10-10-2017
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 5/2019
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-017-3570-y

Other articles of this Issue 5/2019

Microsystem Technologies 5/2019 Go to the issue