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Published in: Journal of Materials Science: Materials in Electronics 1/2014

01-01-2014

Pulsed laser deposition of BiFeO3 thin films with large polarization on Pt(111)/Ti/SiO2/Si by controlling substrate temperature

Authors: M. L. Yi, C. B. Wang, Q. Shen, L. M. Zhang

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2014

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Abstract

Bismuth ferrite (BiFeO3) thin films with large polarization were grown on Pt(111)/Ti/SiO2/Si by optimizing the substrate temperatures (T sub). The BiFeO3 thin films were prepared by pulsed laser deposition and the effects of T sub (T sub = 853–913 K) on crystallization orientation, surface morphology and properties of the films were investigated. The microstructure and morphology of the films showed a strong dependence on T sub. The film prepared at T sub = 893 K had a relatively high degree of (111) preferential orientation and densely packed morphology. A large polarization with the maximum remanent polarization of 108 μC/cm2 was obtained, which was due to the high degree of preferential orientation and the dense surface morphology at the optimum substrate temperature.

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Metadata
Title
Pulsed laser deposition of BiFeO3 thin films with large polarization on Pt(111)/Ti/SiO2/Si by controlling substrate temperature
Authors
M. L. Yi
C. B. Wang
Q. Shen
L. M. Zhang
Publication date
01-01-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-013-1552-0

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