Top

Published in:

2009 | OriginalPaper | Chapter

10. Reliability

Author : Mohammad Azadeh

Published in: Fiber Optics Engineering

Publisher: Springer US

Activate our intelligent search to find suitable subject content or patents.

search-config

AI-assisted search

Off

Abstract

Reliability is a critical concern in all engineering systems. Reliability issues present significant challenges to the designers, because usually it is hard to predict them in advance. As a result, oftentimes problems associated with reliability show up later in the design phase. Moreover, the inherent statistical nature of failures makes them harder to understand and deal with. From an economic perspective, reliability issues are often very expensive, because they expose problems late in the design phase, or even when the systems are deployed and are under normal operation. Such failures may require costly and time consuming maintenance, debugging, or recalls.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

über 102.000 Bücher
über 537 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Finance + Banking
Management + Führung
Marketing + Vertrieb
Maschinenbau + Werkstoffe
Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

über 67.000 Bücher
über 390 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Maschinenbau + Werkstoffe

Jetzt Wissensvorsprung sichern!

inform now

previous chapter Optical Receiver Design

next chapter Test and Measurement

The implicit assumption is that the output function (in our example P(V _S, T)) varies monotonously in the space S or S′. Usually, this is a reasonable assumption.

One g is the acceleration of a free falling body near earth and is equal to 9.8 m/s.

This is the mechanical version of the Fourier uncertainty principle discussed in Chapter 3.

See Chapter 12 for more details on the SFF-8472 requirements.

[1]

R. Barlow, Engineering Reliability, American Statistical Association and the Society for industrial and Applied Mathematics, Philadelphia, PA, 1998

[2]

A. Birolini, Reliability Engineering, Springer, Berlin, 2004

[3]

P. D. T. O'Connor, D. Newton, and R. Bromley, Practical Reliability Engineering, John Wiley & Sons, New York, 2002

[4]

B. S. Dhillon, Design Reliability, Fundamentals and Applications, CRC Press, Boca Raton, FL, 1999

[5]

M. G. Stewart and R. E. Melchers, Probabilistic Assessment of Engineering Systems, Chapman and Hall, London, 1997

[6]

L. A. Doty, Reliability for the Technologies, Industrial Press, New York, 1989

[7]

A. Porter, Accelerated Testing and Validation, Elsevier Inc., Amsterdam, 2004

[8]

MIL-HDBK-217, Reliability Prediction of Electronic Equipment, Department of Defense, Washington, DC

[9]

MIL-HDBK-251, Reliability/Design, Thermal Applications, Department of Defense, Washington, DC

[10]

MIL-HDBK-338, Electronics Reliability Design Handbook, Department of Defense, Washington, DC

[11]

MIL-STD-785, Reliability Program for Systems and Equipment, Development and Production, Department of Defense, Washington, DC

[12]

MIL-STD-790, Reliability Assurance Program for Electronics Parts Specifications, Department of Defense, Washington, DC

[13]

GR-78, Generic Requirements for the Physical Design and Manufacture of Telecommunications Products and Equipment, Telcordia, 1997

[14]

GR-468, Generic Reliability Assurance Requirements for Optoelectronic Devices Used in Telecommunications Equipment, Telcordia, 2004

[15]

Institute for Interconnecting and Packaging Electronic Circuits (IPC), www.ipc.org

[16]

G. Chen et al., “Characterizing diodes for RF ESD protection,” IEEE Electron Device Letters, Vol. 25, pp. 323–325, 2004CrossRef

[17]

H. Ishizuka, “A study of ESD protection devices for input pins. Discharge characteristics of diode, lateral bipolar transistor, and thyristor under MM and HBM tests,” IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part C, Vol. 21, pp. 257–264, 1998CrossRef

[18]

J. Lee et al., “Design of ESD power protection with diode structures for mixed-power supply systems,” IEEE Journal of Solid-State Circuits, Vol. 39, pp. 260–264, 2004CrossRef

[19]

J. S. Huang, “Temperature and current dependences of reliability degradation of buried heterostructure semiconductor lasers,” IEEE Transactions on Device and Materials Reliability, Vol. 5, pp. 150–154, 2005CrossRef

[20]

M. Fukuda, “Laser and LED reliability update,” Journal of Lightwave Technology, Vol. 6, pp. 1488–1495, 1988CrossRef

[21]

A. R. Goodwin, et al., “The design and realization of a high reliability semiconductor laser for single-mode fiber-optical communication links,” Journal of Lightwave Technology, Vol. 6, pp. 1424–1434, 1988CrossRef

[22]

M. Ettenberg and H. Kressel, “The reliability of (AlGa)As CW laser diodes,” IEEE Journal of Quantum Electronics, Vol. 16, pp. 186–196, 1980CrossRef

[23]

D. Kim et al., “Design and fabrication of a transmitter optical subassembly (TOSA) in 10-Gb/s small-form-factor pluggable (XFP) transceiver,” IEEE Journal of Selected Topics in Quantum Electronics, Vol. 12, pp. 776–782, 2006CrossRef

[24]

M. S. Cohen et al., “Low-cost fabrication of optical subassemblies,” Proceedings of the 46th Electronic Components and Technology Conference, pp. 1093–1100, 1996

[25]

TIA-455-160-A, IEC-60793-1-50 (FOTP-160): Measurement Methods and Test Procedures-Damp Heat, TIA, 2003

[26]

GR-326, Single mode Optical Connectors and Jumper Assemblies, Telcordia, 1999

[27]

TIA-455-85-A (FOTP-85) Fiber Optic Cable Twist Test, TIA, 2005

[28]

TIA/EIA-455-88 (FOTP-88) Fiber Optic Cable Bend Test, TIA, 2001

[29]

TIA/EIA-455-158 (FOTP-158) Measurement of Breakaway Frictional Force in Fiber Optic Connector Alignment Sleeves, TIA, 1997

[30]

D. Kececioglu, Robust Engineering Design-by-Reliability with Emphasis on Mechanical Components and Structural Reliability, DEStech Publications, Lancaster, PA, 2003

[31]

O. Vinogradov, Introduction to Mechanical Reliability, A Designer’s Approach, Hemisphere Publishing Corporation, New York, 1991

[32]

G. M. Bubel and M. J. Matthewson, “Optical fiber reliability implications of uncertainty in the fatigue crack growth model,” Optical Engineering, Vol. 30, 737–745, 1991CrossRef

[33]

A. Immonen and E. Niemela, “Survey of reliability and availability prediction methods from the viewpoint of software architecture,” Software and System Modeling, Vol. 7, pp. 49–65, 2008CrossRef

[34]

M. Hecht, “The role of safety analyses in reducing products liability exposure in “Smart” consumer products containing software and firmware,” Annual Reliability and Maintainability Symposium, pp. 153–158, Jan. 2003

[35]

J. Musa, Software Reliability Engineering: More Reliable Software, Faster and Cheaper, AuthorHouse, Bloomington, IN, 2004

[36]

D. Peled, Software Reliability Methods, Springer, Berlin, 2001

[37]

H. Pham, Software Reliability, Springer, Berlin, 2000

[38]

M. Tencer, J.S. Moss, and T. Zapach, “Arrhenius average temperature: the effective temperature for non-fatigue wearout and long term reliability in variable thermal conditions and climates,” IEEE Transactions on Components and Packaging Technologies, Vol. 27, pp. 602–607, 2004CrossRef

[39]

M. S. Cooper, “Investigation of Arrhenius acceleration factor for integrated circuit early life failure region with several failure mechanisms,” IEEE Transactions on Components and Packaging Technologies, Vol. 28, pp. 561–563, 2005CrossRef

[40]

G. Hartler, “Parameter estimation for the Arrhenius model,” IEEE Transactions on Reliability, Vol. 35, pp. 414–418, 1986CrossRef

Title: Reliability
Author: Mohammad Azadeh
Publisher: Springer US
Book: Fiber Optics Engineering
Print ISBN: 978-1-4419-0303-7

Electronic ISBN: 978-1-4419-0304-4

Copyright Year: 2009
DOI: https://doi.org/10.1007/978-1-4419-0304-4_10