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2009 | OriginalPaper | Chapter

11. Test and Measurement

Author : Mohammad Azadeh

Published in: Fiber Optics Engineering

Publisher: Springer US

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Abstract

This chapter deals with measurement and characterization of the critical parameters for fiber optic devices and links. These parameters include quantities such as optical power, extinction ratio, rise and fall time, bit error rate, wavelength, and spectral width. Measurement methods are crucial for evaluation of existing devices and systems as well as for validation and debugging of new designs. Without accurate test and measurement methods, the critical relationship between theory and real world breaks down, effectively rendering most engineering efforts meaningless.

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previous chapter Reliability

next chapter Standards

As noted in Chapter 3, the relationship between rise and fall times and bandwidth depends on the shape of the edges. Equation (11.3) is based on an exponential shape, which is more typical for RC time constants encountered in electrical components.

For a more detailed discussion of eye patterns, see Chapter 3.

According to Nyquist theorem, in order to accurately reconstruct a signal, it should be sampled at a rate at least twice as high as the highest frequency components of that signal.

For a more detailed discussion of jitter refer to Chapter 3.

For a discussion of these and other spectral parameters refer to Chapter 3.

See Chapter 9 for a discussion of waterfall curves.

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Title: Test and Measurement
Author: Mohammad Azadeh
Publisher: Springer US
Book: Fiber Optics Engineering
Print ISBN: 978-1-4419-0303-7

Electronic ISBN: 978-1-4419-0304-4

Copyright Year: 2009
DOI: https://doi.org/10.1007/978-1-4419-0304-4_11