Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 7/2015

01-07-2015

Residual stress in copper paste films on alumina substrates

Authors: S. Fukuda, K. Shimada, N. Izu, W. Shin, K. Hirao, M. Sandou, N. Murayama

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2015

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

The mechanical properties of metal conductor layers strongly influence the reliability of high-power electrical modules. In this study, the microstructure, elastic modulus, and residual stress during temperature cycling of screen-printed sintered paste films were evaluated to develop guidelines for designing metal conductor layers to the module. The number of pores decreased and the elastic modulus increased for paste films sintered at higher temperatures. These films deformed plastically at lower temperatures when heated from room temperature; those that had been sintered at the highest temperature of 800 °C showed the highest maximum compressive stress, which was still approximately one third smaller than that of copper electroplated films. All films developed creep deformation above 200 °C during both heating and cooling processes. The substrate under the film was considered to affect the residual stress in the elastic-deformation area owing to its coefficient of linear thermal expansion and to not affect the residual stress in the creep-deformation area.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference M. Yamagiwa, Ceramics 45, 432 (2010). [in Japanese] M. Yamagiwa, Ceramics 45, 432 (2010). [in Japanese]
3.
go back to reference B. Zhao, D. Feiler, V. Ramanathan, Q.Z. Liu, M. Brongo, J. Wu, H. Zhang, J.C. Kuei, D. Young, J. Brown, C. Vo, W. Xia, C. Chu, J. Zhou, C. Nguyen, L. Tsau, D. Dornisch, L. Camilletti, P. Ding, G. Lai, B. Chin, N. Krishna, M. Johnson, J. Turner, T. Ritzdorf, G. Wu, L. Cook, Electrochem. Solid-State Lett. 1, 276 (1998)CrossRef B. Zhao, D. Feiler, V. Ramanathan, Q.Z. Liu, M. Brongo, J. Wu, H. Zhang, J.C. Kuei, D. Young, J. Brown, C. Vo, W. Xia, C. Chu, J. Zhou, C. Nguyen, L. Tsau, D. Dornisch, L. Camilletti, P. Ding, G. Lai, B. Chin, N. Krishna, M. Johnson, J. Turner, T. Ritzdorf, G. Wu, L. Cook, Electrochem. Solid-State Lett. 1, 276 (1998)CrossRef
4.
go back to reference C.-K. Hu, L. Gignac, S.G. Malhotra, R. Rosenberg, S. Boettcher, Appl. Phys. Lett. 78, 904 (2001)CrossRef C.-K. Hu, L. Gignac, S.G. Malhotra, R. Rosenberg, S. Boettcher, Appl. Phys. Lett. 78, 904 (2001)CrossRef
6.
7.
go back to reference Y. Kim, B. Lee, S. Yang, I. Byun, I. Jeong, S.M. Cho, Curr. Appl. Phys. 12, 473 (2012)CrossRef Y. Kim, B. Lee, S. Yang, I. Byun, I. Jeong, S.M. Cho, Curr. Appl. Phys. 12, 473 (2012)CrossRef
8.
9.
go back to reference A. Sekiguchi, J. Koike, K. Maruyama, J. Jpn. Inst. Metals 64, 379 (2000). [in Japanese] A. Sekiguchi, J. Koike, K. Maruyama, J. Jpn. Inst. Metals 64, 379 (2000). [in Japanese]
10.
go back to reference T. Onishi, H. Fujii, T. Yoshikawa, J. Munemasa, T. Inoue, A. Miyagaki, Thin Solid Films 425, 265 (2003)CrossRef T. Onishi, H. Fujii, T. Yoshikawa, J. Munemasa, T. Inoue, A. Miyagaki, Thin Solid Films 425, 265 (2003)CrossRef
11.
12.
go back to reference T. Onishi, M. Mizuno, T. Fujikawa, T. Yoshikawa, J. Munemasa, M. Mizuno, T. Kihara, H. Araki, Y. Shirai, J. Electron. Mater. 40, 1384 (2011)CrossRef T. Onishi, M. Mizuno, T. Fujikawa, T. Yoshikawa, J. Munemasa, M. Mizuno, T. Kihara, H. Araki, Y. Shirai, J. Electron. Mater. 40, 1384 (2011)CrossRef
13.
go back to reference P.A. Flinn, D.S. Gardner, W.D. Nix, IEEE Trans. Electron Device ED–34, 689 (1987)CrossRef P.A. Flinn, D.S. Gardner, W.D. Nix, IEEE Trans. Electron Device ED–34, 689 (1987)CrossRef
15.
go back to reference H.J. Frost, M.F. Ashby, Deformation mechanism maps (Pergamon Press, Oxford, 1982) H.J. Frost, M.F. Ashby, Deformation mechanism maps (Pergamon Press, Oxford, 1982)
16.
go back to reference ANSYS, Programmer’s Manual for Mechanical APDL (ANSYS, Canonsburg, 2009), p. 99 ANSYS, Programmer’s Manual for Mechanical APDL (ANSYS, Canonsburg, 2009), p. 99
Metadata
Title
Residual stress in copper paste films on alumina substrates
Authors
S. Fukuda
K. Shimada
N. Izu
W. Shin
K. Hirao
M. Sandou
N. Murayama
Publication date
01-07-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 7/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-2953-z

Other articles of this Issue 7/2015

Journal of Materials Science: Materials in Electronics 7/2015 Go to the issue