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Published in: Journal of Materials Science: Materials in Electronics 2/2010

01-02-2010

Saturation magnetization and structural analysis of Ni0.6Zn0.4Nd y Fe2−y O4 by XRD, IR and SEM techniques

Authors: T. J. Shinde, A. B. Gadkari, P. N. Vasambekar

Published in: Journal of Materials Science: Materials in Electronics | Issue 2/2010

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Abstract

Compositions having general formula Ni0.6Zn0.4Nd y Fe2−y O4 (where y = 0, 0.01, 0.02 and 0.03) were prepared by oxalate co-precipitation method from high purity sulphates. The samples were characterized by XRD, IR and SEM techniques. X-ray diffraction measurements confirmed the formation of single phase cubic spinel structure. Lattice constant increases with rise in Nd3+ content and obeys Vegard’s law. Crystallite size of the samples lies in the range 29.98–31.15 nm. The IR spectra shows two strong absorption bands in the frequency range 400–600 cm−1. Further, it shows that Nd3+ occupies B-site. SEM studies show that the grain size of the samples decreases with increase in Nd3+ content. Saturation magnetization of Nd3+ substituted Ni–Zn ferrites is higher than unsubstituted ferrite.

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Metadata
Title
Saturation magnetization and structural analysis of Ni0.6Zn0.4Nd y Fe2−y O4 by XRD, IR and SEM techniques
Authors
T. J. Shinde
A. B. Gadkari
P. N. Vasambekar
Publication date
01-02-2010
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 2/2010
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-009-9878-3

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